Integrated Test Scheduling, Test Parallelization and TAM Design

• We propose a technique integrating test scheduling, scan chain partitioning and test access mechanism (TAM) design minimizing the test time and the TAM routing cost while considering test conflicts and power constraints. Main features of our technique are (1) the flexibility in modelling the systems test behaviour and (2) the support for interconnection test of unwrapped cores and user-defined logic. Experiments using our implementation on several benchmarks and industrial designs demonstrate that it produces high quality solution at low computational cost.

Ämnesord

NATURVETENSKAP  -- Data- och informationsvetenskap -- Datavetenskap (hsv//swe)

NATURAL SCIENCES  -- Computer and Information Sciences -- Computer Sciences (hsv//eng)

Nyckelord

test access mechanism

TAM

TAM routing

test scheduling

scan chain partitioning

test conflicts

power constraints

Computer science

Datavetenskap

Publikations- och innehållstyp

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