The potential of elemental analysis of light elements by measuring elastically scattered particles as a complement to PIXE (Particle Induced X-ray Emission analysis), when using a 3 MV electrostatic tandem accelerator is discussed. The discussion is based on protons and He ions with energies suitable for PIXE. Some experimental results of scattering yields are included.
TEKNIK OCH TEKNOLOGIER -- Maskinteknik -- Produktionsteknik, arbetsvetenskap och ergonomi (hsv//swe)
ENGINEERING AND TECHNOLOGY -- Mechanical Engineering -- Production Engineering, Human Work Science and Ergonomics (hsv//eng)