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Impact of Trapping ...
Impact of Trapping Effects on the Recovery Time of GaN Based Low Noise
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- Axelsson, Olle, 1986 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Billström, Niklas (författare)
- Saab AB,Saab
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- Rorsman, Niklas, 1964 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Thorsell, Mattias, 1982 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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(creator_code:org_t)
- Institute of Electrical and Electronics Engineers (IEEE), 2016
- 2016
- Engelska.
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Ingår i: IEEE Microwave and Wireless Components Letters. - : Institute of Electrical and Electronics Engineers (IEEE). - 1558-1764 .- 1531-1309. ; 26:1, s. 31-33
- Relaterad länk:
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http://dx.doi.org/10...
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https://doi.org/10.1...
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https://research.cha...
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Abstract
Ämnesord
Stäng
- This study investigates recovery time of the gain of AlGaN/GaN HEMT based low noise amplifiers (LNA) after an input overdrive pulse. Three LNAs, fabricated in two commercial MMIC processes and a Chalmers in-house process, are evaluated. The Chalmers process has an unintentionally doped buffer instead of the intentional Fe doping of the buffer which is standard in commercial GaN HEMT technologies. It is shown that the LNAs from the two commercial processes experience a severe drop in gain after input overdrive pulses higher than 28 dBm, recovering over a duration of around 20 ms. In contrast the LNA fabricated in-house at Chalmers experienced no visible effects up to an input power of 33 dBm. These results have impact for radar and electronic warfare receivers, which need to be operational immediately after an overdrive pulse. The long time constants suggest that these effects are due to trapping in the transistors with the Fe doped buffer playing an important role.
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Nyckelord
- Gallium nitride
- low-noise amplifiers
- robustness
- MMICs
Publikations- och innehållstyp
- art (ämneskategori)
- ref (ämneskategori)
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