| 1. |
- Aurino, Pier Paolo, 1985, et al.
(författare)
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Retention of Electronic Conductivity in LaAlO3/SrTiO3 Nanostructures Using a SrCuO2 Capping Layer
- 2016
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Ingår i: Physical Review Applied. - : American Physical Society. - 2331-7019. ; 6:2
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Tidskriftsartikel (refereegranskat)abstract
- The interface between two wide band-gap insulators, LaAlO3 and SrTiO3 (LAO/STO) offers a unique playground to study the interplay and competitions between different ordering phenomena in a strongly correlated two- dimensional electron gas. Recent studies of the LAO/STO interface reveal the inhomogeneous nature of the 2DEG that strongly influences electrical-transport properties. Nanowires needed in future applications may be adversely affected, and our aim is, thus, to produce a more homogeneous electron gas. In this work, we demonstrate that nanostructures fabricated in the quasi-2DEG at the LaAlO3/SrTiO3 interface, capped with a SrCuO2 layer, retain their electrical resistivity and mobility independent of the structure size, ranging from 100 nm to 30 mu m. This is in contrast to noncapped LAO/STO structures, where the room-temperature electrical resistivity significantly increases when the structure size becomes smaller than 1 mu m. High-resolution intermodulation electrostatic force microscopy reveals an inhomogeneous surface potential with "puddles" of a characteristic size of 130 nm in the noncapped samples and a more uniform surface potential with a larger characteristic size of the puddles in the capped samples. In addition, capped structures show superconductivity below 200 mK and nonlinear currentvoltage characteristics with a clear critical current observed up to 700 mK. Our findings shed light on the complicated nature of the 2DEG at the LAO/STO interface and may also be used for the design of electronic devices.
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| 2. |
- Borgani, Riccardo, et al.
(författare)
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Background-Force Compensation in Dynamic Atomic Force Microscopy
- 2017
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Ingår i: Physical Review Applied. - : AMER PHYSICAL SOC. - 2331-7019. ; 7:6
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Tidskriftsartikel (refereegranskat)abstract
- Background forces are linear long-range interactions of the cantilever body with its surroundings that must be compensated for in order to reveal tip-surface force, the quantity of interest for determining material properties in atomic force microscopy. We provide a mathematical derivation of a method to compensate for background forces, apply it to experimental data, and discuss how to include background forces in simulation. Our method, based on linear-response theory in the frequency domain, provides a general way of measuring and compensating for any background force and it can be readily applied to different force reconstruction methods in dynamic AFM.
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| 3. |
- Borgani, Riccardo, et al.
(författare)
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Fast Multifrequency Measurement of Nonlinear Conductance
- 2019
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Ingår i: Physical Review Applied. - : American Physical Society. - 2331-7019. ; 11:4
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Tidskriftsartikel (refereegranskat)abstract
- We describe a phase-coherent multifrequency lock-in measurement technique that uses the inverse Fourier transform to reconstruct the nonlinear current-voltage characteristic of a nanoscale junction. The method provides separation of the galvanic and displacement currents in the junction and easy cancellation of the parasitic displacement current from the measurement leads. These two features allow us to overcome traditional limitations imposed by the low conductance of the junction and the high capacitance of the leads, thus providing an increase in measurement speed of several orders of magnitude. We demonstrate the method in the context of conductive atomic force microscopy, acquiring current-voltage characteristics at every pixel while scanning at standard imaging speed.
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| 4. |
- Thorén, Per-Anders, et al.
(författare)
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Modeling and Measuring Viscoelasticity with Dynamic Atomic Force Microscopy
- 2018
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Ingår i: Physical Review Applied. - : AMER PHYSICAL SOC. - 2331-7019. ; 10:2
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Tidskriftsartikel (refereegranskat)abstract
- The interaction between a rapidly oscillating atomic-force-microscope tip and a soft-material surface is described with use of both elastic and viscous forces in a moving-surface model. We present the simplest form of this model, motivating our derivation with the models ability to capture the impact dynamics of the tip and sample with an interaction consisting of two components: interfacial or surface force, and bulk or volumetric force. Analytic solutions to the piecewise linear model identify characteristic time constants, providing a physical explanation for the hysteresis observed in the measured dynamic-force-quadrature curves. Numerical simulation is used to fit the model to experimental data, and excellent agreement is found with a variety of different samples. The model parameters form a dimensionless impact-rheology factor, giving a quantitative physical number to characterize a viscoelastic surface that does not depend on the tip shape or cantilever frequency.
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