SwePub
Sök i SwePub databas

  Utökad sökning

Träfflista för sökning "LAR1:hh ;srt2:(2005-2009);pers:(Pettersson Håkan)"

Sökning: LAR1:hh > (2005-2009) > Pettersson Håkan

  • Resultat 1-10 av 29
Sortera/gruppera träfflistan
   
NumreringReferensOmslagsbildHitta
1.
  • Bordag, Michael, et al. (författare)
  • Parallel nano-assembly directed by short-range field forces
  • 2006
  • Ingår i: Proceedings of the 1st IEEE International Conference on Nano/Micro Engineered and Molecular Systems. - Piscataway, United States : IEEE Press. - 9781424401390 ; , s. 620-622
  • Konferensbidrag (refereegranskat)abstract
    • We present the ECs Sixth Framework Programme PARNASS project, which stands for 'Parallel nano assembling directed by short-range field forces' and represents a radical innovative approach to fabricating large volumes of hybrid nano electronic devices. The project combines in a synergy the 'top-down' and 'bottom-up' methods addressing one of the challenging physical and engineering problems of the very high accuracy over a large area. An array of specially designed nano-scale force field sources has to be a key part of this innovative approach to large-scale nano manufacturing. © 2006 IEEE.
  •  
2.
  • Bordag, Michael, et al. (författare)
  • Shear stress measurements on InAs nanowires by AFM manipulation
  • 2007
  • Ingår i: Small. - Weinheim : Wiley-VCH Verlagsgesellschaft. - 1613-6810 .- 1613-6829. ; 3:8, s. 1398-1401
  • Tidskriftsartikel (refereegranskat)abstract
    • On an upward curve? The curvature of an elastically deformed nanowire pinned to a flat surface contains information about the maximum static friction force, and hence the shear stress, between the nanowire and the surface. Here, InAs nanowires are bent in a controlled manner using the tip of an atomic force microscope (see image). The shear stress can be obtained from a simple analysis according to the standard theory of elasticity.
  •  
3.
  • Conache, Gabriela, et al. (författare)
  • AFM-based manipulation of InAs nanowires
  • 2008
  • Ingår i: Proceedings of the IVC-17 (17th International Vacuum Congress) [also] ICSS-13 (13th International Conference on Surface Science) [also] ICN+T-2007 (International Conference on Nanoscience and Technology). - Bristol : Institute of Physics (IOP). ; 100, s. 052051-052051
  • Konferensbidrag (refereegranskat)abstract
    • A controlled method of manipulation of nanowires was found using the tip of an Atomic Force Microscope (AFM). Manipulation is done in the ‘Retrace Lift’ mode, where feedback is turned off for the reverse scan and the tip follows a nominal path. The effective manipulation force during the reverse scan can be changed by varying an offset in the height of the tip over the surface. Using this method, we have studied InAs nanowires on different substrates. We have also investigated interactions between wires and with gold features patterned onto the substrates.
  •  
4.
  • Conache, Gabriela, et al. (författare)
  • Friction measurements of InAs nanowires on Silicon nitride by AFM manipulation
  • 2009
  • Ingår i: Small. - Weinheim, Germany : Wiley-VCH Verlagsgesellschaft. - 1613-6810 .- 1613-6829. ; 5:2, s. 203-207
  • Tidskriftsartikel (refereegranskat)abstract
    • A study was conducted to perform friction measurements of InAs nanowires (NW) on silicon nitride (Si 3N 4) through atomic force microscopy (AFM) manipulation. The investigations revealed the friction force per unit length for sliding and static friction over a range of nanowire diameters. It was found that there is a significant difference between the coefficients of the two sliding modes for large wires. It was also found that the difference between the two sliding modes disappears at smaller diameters and the sliding friction becomes equal with the static friction. The AFM investigations were performed on a Nanoscope IIIa Dimension 3100, using rectangular cantilevers, with a nominal spring constant of 30 N m -1. The nanowires were manipulated, using the 'Retrace Lift' mode of the AFM controller. The friction force per unit length was gathered from the local curvature of the NWs, using standard elasticity theory.
  •  
5.
  • Conache, Gabriela, 1977-, et al. (författare)
  • Nanowire friction with an applied bias
  • 2009
  • Konferensbidrag (refereegranskat)abstract
    • Recently, we have shown how the friction acting on nanowires pushed across a surface by an AFM tip can be determined by measuring the radius of curvature of the bent wire aŸer manipulation. This technique allows us to study the friction properties of an extended mesoscale contact. Our main focus has been to determine whether such contacts behave like macroscopic objects, in which dišerences between the 'true' and 'apparent' contact areas play a key role and friction varies linearly with the applied normal force, or whether they are more like atomic-scale point contacts, wheremore fundamental processes dominate and friction oŸen is independent of the normal force. In this work we show how the friction between InAs nanowires and an insulating silicon nitride layer on a conductive silicon substrate varies when a DC voltage is applied to the AFM tip during manipulation. e tip charges the capacitor formed by the wire and the grounded silicon back contact, giving rise to attractive Coulomb forces and thus increasing the contact pressure between the wire and the silicon nitride. In this way we can vary the normal force on the sliding surfaces using a single wire, with a constant structure and contact geometry. Using nanowires of about 40-50 nm diameter and a few microns in length we have applied tip voltages in the range +12 to -12 V. Simplemodeling indicates that these voltages su›ce to give similar levels of band-lling and depletion to when the same wires are used in working wrap-gate or back-gate devices. A monotonic increase of the sliding friction with the voltage applied on the tip was observed. is implies that the friction increases with the normal force and that this mesoscopic system behaves more like a macroscopic contact, despite the nanometer size of the contact in the direction of motion.
  •  
6.
  • Hoglund, L, et al. (författare)
  • Selective optical doping to predict the performance and reveal the origin of photocurrent peaks in quantum dots-in-a-well infrared photodetectors
  • 2009
  • Ingår i: INFRARED PHYSICS and TECHNOLOGY. - Exeter : Elsevier BV. - 1350-4495 .- 1879-0275. ; 52:6, s. 272-275
  • Tidskriftsartikel (refereegranskat)abstract
    • Resonant optical pumping across the band gap was used as artificial doping in InAs/In0.15Ga0.85As/GaAs quantum dots-in-a-well infrared photodetectors. Through efficient filling of the quantum dot energy levels by simultaneous optical pumping into the ground states and the excited states of the quantum dots, the response was increased by a factor of 10. Low temperature photocurrent peaks observed at 120 and 148 meV were identified as intersubband transitions emanating from the quantum dot ground state and the quantum dot excited state, respectively by a selective increase of the electron population in the different quantum dot energy levels.
  •  
7.
  • Höglund, Linda, 1974-, et al. (författare)
  • Bias and temperature dependence of the escape processes in quantum dots-in-a-well infrared photodetectors
  • 2008
  • Ingår i: Applied Physics Letters. - New York : American Institute of Physics (AIP). - 0003-6951 .- 1077-3118. ; 93:10, s. 103501-
  • Tidskriftsartikel (refereegranskat)abstract
    • The performance of quantum dots-in-a-well infrared photodetectors (DWELL IPs) has been studied by means of interband and intersubband photocurrent measurements as well as dark current measurements. Using interband photocurrent measurements, substantial escape of electrons from lower lying states in the DWELL structure at large biases was revealed. Furthermore, a significant variation in the escape probability from energy states in the DWELL structure with applied bias was observed. These facts can explain the strong temperature and bias dependence of both photocurrent and dark currents in DWELL IPs.
  •  
8.
  • Höglund, Linda, 1974-, et al. (författare)
  • Bias mediated tuning of the detection wavelength in asymmetrical quantum dots-in-a-well infrared photodetectors
  • 2008
  • Ingår i: Applied Physics Letters. - New York : AIP Publishing. - 0003-6951 .- 1077-3118. ; 93:20
  • Tidskriftsartikel (refereegranskat)abstract
    • Bias-mediated tuning of the detection wavelength within the infrared wavelength region is demonstrated for quantum dots-in-a-well and dots-on-a-well infrared photodetectors. By positioning the InAs quantum dot layer asymmetrically in an 8 nm wide In0.15Ga0.85As/GaAs quantum well, a shift in the peak detection wavelength from 8.4 to 10.3 mu m was observed when reversing the polarity of the applied bias. For a dots-on-a-well structure, the peak detection wavelength was tuned from 5.4 to 8 mu m with small changes in the applied bias. These tuning properties could be essential for applications such as modulators and dual-color infrared detection.
  •  
9.
  •  
10.
  • Höglund, Linda, 1974-, et al. (författare)
  • Optical pumping as artificial doping in quantum dots-in-a-well infrared photodetectors
  • 2009
  • Ingår i: Applied Physics Letters. - New York : AIP Publishing. - 0003-6951 .- 1077-3118. ; 94:5, s. 053503-
  • Tidskriftsartikel (refereegranskat)abstract
    • Resonant optical pumping across the band gap was used as artificial doping in InAs/In0.15Ga0.85As/GaAs quantum dots-in-a-well infrared photodetectors. By selectively increasing the electron population in the different quantum dot energy levels, the low temperature photocurrent peaks observed at 120 and 148 meV, could be identified as intersubband transitions emanating from the quantum dot ground state and the quantum dot excited state, respectively. With efficient filling of the quantum dot energy levels through simultaneous optical pumping into the ground states and the excited states of the quantum dots, the response was increased by a factor of 10.
  •  
Skapa referenser, mejla, bekava och länka
  • Resultat 1-10 av 29

Kungliga biblioteket hanterar dina personuppgifter i enlighet med EU:s dataskyddsförordning (2018), GDPR. Läs mer om hur det funkar här.
Så här hanterar KB dina uppgifter vid användning av denna tjänst.

 
pil uppåt Stäng

Kopiera och spara länken för att återkomma till aktuell vy