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- Strokan, N.B., et al.
(författare)
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Detection of strongly and weakly ionizing radiation by triode structure based on SIC films
- 2003
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Ingår i: Journal of Applied Physics. - 0021-8979. ; 93:9, s. 5714-5719
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Tidskriftsartikel (refereegranskat)abstract
- The detection of strongly and weakly ionizing radiation by triode structure based on silicon carbide (SiC) films was discussed. The possibility of alpha particle spectrometry in spite of slow carrier transport via diffusion was demonstrated. Analysis showed that the signal generated by weakly ionizing radiation incident on a film had low amplitude.
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| 4. |
- Strokan, N.B., et al.
(författare)
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Measurement of micrometer diffusion lengths by nuclear spectrometry
- 2005
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Ingår i: Semiconductors (Woodbury, N.Y.). - 1063-7826. ; 39:12, s. 1394-1398
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Tidskriftsartikel (refereegranskat)abstract
- A method for determination of diffusion lengths in the range 0.5-50 µm, which corresponds to carrier lifetimes in the nanosecond range, is suggested A calibrated nonequilibrium charge is injected into the base of the reverse-biased diode structure. The injection is provided by alpha particles generated by natural decay in the single-particle counting mode. The nuclear spectrometry technique is used to measure the amount of charge that diffused across the base to the boundary of the electric-field region. The loss of charge during the diffusion is calculated as a function of the depth of alpha particle penetration beyond the electric-field region. The derived power-law functions make it possible to relate the diffusion length with the exponent and numerical factor that describes the loss of charge. The experiment is performed with lightly doped 4H-SiC epitaxial films. © 2005 Pleiades Publishing, Inc.
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| 5. |
- Strokan, N.B., et al.
(författare)
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Radiation resistance of transistor- and diode-type SiC detectors irradiated with 8-MeV protons
- 2004
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Ingår i: Semiconductors (Woodbury, N.Y.). - 1063-7826. ; 38:7, s. 807-811
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Tidskriftsartikel (refereegranskat)abstract
- Nuclear-particle detectors based on SiC with a structure composed of an n+-type substrate, a p-type epitaxial layer, and a Schottky barrier are studied. Structures with a ~10-µm-thick 6H-SiC layer exhibit transistor properties, whereas those with a ~30-µm-thick 4H-SiC layer exhibit diode properties. It is established that a more than tenfold amplification of the signal is observed in the transistor-type structure. The amplification is retained after irradiation with 8-MeV protons with a dose of at least 5 × 1013 cm-2, in this case, the resolution is =10%. Amplification of the signal was not observed in the structures of diode type. However, there were diode-type detectors with a resolution of ˜3%, which is acceptable for a number of applications, even after irradiation with the highest dose of 2 × 1014 cm-2. © 2004 MAIK "Nauka/Interperiodica".
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| 6. |
- Strokan, N.B., et al.
(författare)
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The limiting energy resolution of SiC detectors in ion spectrometry
- 2005
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Ingår i: Semiconductors (Woodbury, N.Y.). - 1063-7826. ; 39:12, s. 1420-1425
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Tidskriftsartikel (refereegranskat)abstract
- The Monte Carlo method is used to simulate the complete stopping of a particles in SiC. A histogram of energy losses in nuclear-scattering events is obtained. The energy-loss spectrum has the characteristic asymmetric shape with the line full width at the half-maximum FWHMnucl ˜ 4. 22 keV. The final shape of the spectral line is obtained by a convolution with the Gaussian function that describes the contribution of the ionization and noise fluctuations (originated in the detector and instrumentation) to the signal. The resulting value of FWHM for the line is equal to 8.75 keV (at a noise variance of 1.7 keV). The experimental energy resolution of the detectors was found to be poorer than the calculated value by a factor of 2. It is established that the losses of charge during its transport in the detector bulk are insignificant, so that the discrepancy between the calculated and experimental values of the resolution should be attributed to the nonoptimal design of the detector window. © 2005 Pleiades Publishing, Inc.
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