| 1. |
- Abdalla, Munir A, et al.
(författare)
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A CMOS APS for dental X-ray imaging using scintillating sensors
- 2001
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Ingår i: Nuclear Instruments and Methods in Physics Research Section A. - 0168-9002 .- 1872-9576. ; 460:1, s. 197-203
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Tidskriftsartikel (refereegranskat)abstract
- In this paper we present an integrating CMOS Active Pixel Sensor (APS) circuit to be used with scintillator type X-ray sensors for intra oral dental X-ray imaging systems. Different pixel architectures were constructed to explore their performance characteristics and to study the feasibility of the development of such systems using the CMOS technology. A prototype 64 x 80 pixel array has been implemented in a CMOS 0.8 mum double poly n-well process with a pixel pitch of 50 mum. A spectral sensitivity measurement for the different pixels topologies, as well as measured X-ray direct absorption in the different APSs are presented. A measurement of the output signal showed a good linearity over a wide dynamic range. This chip showed that the very low sensitivity of the CMOS APSs to direct X-ray exposure adds a great advantage to the various CMOS advantages over CCD-based imaging systems,
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| 2. |
- Abdalla, Munir A, et al.
(författare)
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A new biasing method for CMOS preamplifier-shapers
- 2000
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Ingår i: ICECS 2000: 7TH IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS & SYSTEMS, VOLS I AND II. ; , s. 15-18
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Konferensbidrag (refereegranskat)
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| 3. |
- Abdalla, Munir A, et al.
(författare)
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An integrating CMOS APS for X-ray imaging with an in-pixel preamplifier
- 2001
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Ingår i: Nuclear Instruments and Methods in Physics Research Section A. - 0168-9002 .- 1872-9576. ; 466:1, s. 232-236
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Tidskriftsartikel (refereegranskat)abstract
- We present in this paper an integrating CMOS Active Pixel Sensor (APS) circuit coated with scintillator type sensors for intra-oral dental X-ray imaging systems. The photosensing element in the pixel is formed by the p-diffusion on the n-well diode. The advantage of this photosensor is its very low direct absorption of X-rays compared to the other available photosensing elements in the CMOS pixel. The pixel features an integrating capacitor in the feedback loop of a preamplifier of a finite gain in order to increase the optical sensitivity. To verify the effectiveness of this in-pixel preamplification, a prototype 32 x 80 element CMOS active pixel array was implemented in a 0.8 mum CMOS double poly, n-well process with a pixel pitch of 50 mum. Measured results confirmed the improved optical sensitivity performance of the APS. Various measurements on device performance are presented.
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| 4. |
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| 5. |
- Aboelfotoh, M. O., et al.
(författare)
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Schottky-barrier behavior of metals on n- and p-type 6H-SiC
- 2003
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Ingår i: Physical Review B. Condensed Matter and Materials Physics. - 1098-0121 .- 1550-235X. ; 67:7, s. 075312-
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Tidskriftsartikel (refereegranskat)abstract
- The Schottky-barrier height of a number of metals (Ti, Ni, Cu, and Au) on n- and p-type Si-terminated 6H-SiC has been measured in the temperature range 150-500 K. It is found that the barrier height to n-type 6H-SiC does not exhibit a temperature dependence, while for p-type 6H-SiC the change in the barrier height with temperature follows very closely the change in the indirect energy gap in 6H-SiC. These results are inconsistent with models of Schottky-barrier formation based on the concept of a charge neutrality level. Furthermore, the present results cannot be reconciled with a defect pinning mechanism, contrary to the conclusions of earlier studies on III-V compound semiconductors. We suggest that chemical bonding at the metal-semiconductor interface plays an important role in determining the Schottky-barrier height.
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| 6. |
- An, Siwen, et al.
(författare)
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Signal-to-Noise Ratio Optimization in X-ray Fluorescence Spectrometry for Chromium Contamination Analysis
- 2021
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Ingår i: Talanta. - : Elsevier BV. - 0039-9140 .- 1873-3573. ; 230
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Tidskriftsartikel (refereegranskat)abstract
- In most cases, direct X-ray fluorescence (XRF) analysis of solutions entails technical difficulties due to a high X-ray scattering background resulting in a spectrum with a poor signal-to-noise ratio (SNR). Key factors that determine the sensitivity of the method are the energy resolution of the detector and the amount of scattered radiation in the energy range of interest. Limiting the width of the primary spectrum by the use of secondary targets, or filters, can greatly improve the sensitivity for specific portions of the spectrum. This paper demonstrates a potential method for SNR optimization in direct XRF analysis of chromium (Cr) contamination. The suggested method requires minimal sample preparation and achieves higher sensitivity compared to existing direct XRF analysis. Two states of samples, fly ash and leachate from municipal solid waste incineration, were investigated. The effects of filter material, its absorption edge and filter thickness were analyzed using the combination of Monte Carlo N-Particle (MCNP) code and energy-dispersive XRF spectrometry. The applied filter removes primary photons with energies interfering with fluorescence photons from the element of interest, thus results in lower background scattering in the spectrum. The SNR of Cr peak increases with filter thickness and reaches a saturation value when further increased thickness only increases the measurement time. Measurements and simulations show that a Cu filter with a thickness between 100 μm and 140 μm is optimal for detecting Cr by taking into account both the SNR and the exposure time. With direct XRF analysis for solutions, the limit of quantitation (LOQ) of the achieved system was 0.32 mg/L for Cr, which is well below the allowed standard limitation for landfills in Sweden. This work shows that XRF can gain enough sensitivity for direct monitoring to certify that the Cr content in leachate is below environmental limits.
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| 7. |
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| 8. |
- Badel, Xavier, et al.
(författare)
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Improvement of an X-ray imaging detector based on a scintillating guides screen
- 2002
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Ingår i: Nuclear Instruments and Methods in Physics Research Section A. - 0168-9002 .- 1872-9576. ; 487:1-2, s. 129-135
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Tidskriftsartikel (refereegranskat)abstract
- An X-ray imaging detector has been developed for dental applications. The principle of this detector is based on application of a silicon charge coupled device covered by a scintillating wave-guide screen. Previous studies of such a detector showed promising results concerning the spatial resolution but low performance in terms of signal to noise ratio (SNR) and sensitivity. Recent results confirm the wave-guiding properties of the matrix and show improvement of the detector in terms of response uniformity, sensitivity and SNR. The present study is focussed on the fabrication of the scintillating screen where the principal idea is to fill a matrix of Si pores with a CsI scintillator. The photoluminescence technique was used to prove the wave-guiding property of the matrix and to inspect the filling uniformity of the pores. The final detector was characterized by X-ray evaluation in terms of spatial resolution, light output and SNR. A sensor with a spatial resolution of 9 LP/mm and a SNR over 50 has been achieved using a standard dental X-ray source and doses in the order of those used at the moment by dentists (around 25 mR).
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| 9. |
- Badel, Xavier, et al.
(författare)
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Metallized and oxidized silicon macropore arrays filled with a scintillator for CCD-based X-ray imaging detectors
- 2004
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Ingår i: IEEE Transactions on Nuclear Science. - : IEEE. - 0018-9499 .- 1558-1578. ; 51:3, s. 1001-1005, s. 1006-1010
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Tidskriftsartikel (refereegranskat)abstract
- Silicon charge-coupled devices (CCDs) covered with a scintillating film are now available on the market for use in digital medical imaging. However, these devices could still be improved in terms of sensitivity and especially spatial resolution by coating the CCD with an array of scintillating waveguides. In this paper, such waveguides were fabricated by first etching pores in silicon, then performing metallization or oxidation of the pore walls and finally filling the pores with CsI(TI). The resulting structures were observed using scanning electron microscopy and tested under X-ray exposure. Theoretical efficiencies of macropore arrays filled with CsI(TI) were also calculated, indicating that the optimal pore depth for metallized macropore arrays is about 80 mum while it is around 350 mum for oxidized ones. This result, together with the roughness of the metal coating, explains why lower SNR values were measured with the metallized macropores. Indeed, the macropore arrays had depths in the range of 210-390 mum, which is favorable to oxidized structures.
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| 10. |
- Badel, Xavier, et al.
(författare)
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Performance of scintillating waveguides for CCD-based X-ray detectors
- 2006
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Ingår i: IEEE Transactions on Nuclear Science. - 0018-9499 .- 1558-1578. ; 53:1, s. 3-8
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Tidskriftsartikel (refereegranskat)abstract
- Scintillating films are usually used to improve the sensitivity of CCD-based X-ray imaging detectors. For an optimal spatial resolution and detection efficiency, a tradeoff has to be made on the film thickness. However, these scintillating layers can also be structured to provide a pixellated screen. In this paper, the study of CsI(TI)-filled pore arrays is reported. The pores are first etched in silicon, then oxidized and finally filled with CsI(TI) to form scintillating waveguides. The dependence of the detector sensitivity on pore depth, varied from 40 to 400 mu m here, follows rather well theoretical predictions. Most of the detectors produced in this work have a detective quantum efficiency of the incoming X-ray photons of about 25%. However, one detector shows that higher efficiency can be achieved approaching almost the theoretical limit set by Poisson statistics of the incoming X-rays. Thus, we conclude that it is possible to fabricate scintillating waveguides with almost ideal performance. Imaging capabilities of the detectors are demonstrated.
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