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- Ahlberg, Daniel, 1982, et al.
(författare)
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Noise sensitivity in continuum percolation
- 2014
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Ingår i: Israel Journal of Mathematics. - : Springer Science and Business Media LLC. - 0021-2172 .- 1565-8511. ; 201:2, s. 847-899
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Tidskriftsartikel (refereegranskat)abstract
- We prove that the Poisson Boolean model, also known as the Gilbert disc model, is noise sensitive at criticality. This is the first such result for a Continuum Percolation model, and the first which involves a percolation model with critical probability pc not equal 1/2. Our proof uses a version of the Benjamini-Kalai-Schramm Theorem for biased product measures. A quantitative version of this result was recently proved by Keller and Kindler. We give a simple deduction of the non-quantitative result from the unbiased version. We also develop a quite general method of approximating Continuum Percolation models by discrete models with pc bounded away from zero; this method is based on an extremal result on non-uniform hypergraphs.
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| 2. |
- Visibile, Alberto, 1989, et al.
(författare)
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An Alternative Method of Measuring Area Specific Resistance of Chromia Scales Using Electrochemical Impedance Spectroscopy
- 2023
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Ingår i: Journal of the Electrochemical Society. - : The Electrochemical Society. - 0013-4651 .- 1945-7111. ; 170:3
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Tidskriftsartikel (refereegranskat)abstract
- A novel method that employs electrochemical impedance spectroscopy (EIS) is developed to characterize the oxide scale resistance and thickness of Crofer 22 APU after exposure at 800 degrees C in humidified air. Crofer 22 APU, is one of the most commonly used materials for solid oxide fuel cell (SOFC) interconnects, an application for which oxide scale resistance is of paramount importance. The kinetics of oxide growth were studied for up to 6,000 h using three different techniques: electron microscopy of cross-sections, gravimetry, and EIS capacitance measurements of the oxide scale. EIS was used to evaluate the scale thickness starting from the material capacitance, and the material resistance at high temperature was estimated using extrapolation of the impedance values at room temperature. The result obtained with this novel EIS method are comparable to those obtained using conventional techniques, and in addition, the new method is cheaper, faster, and more reliable. Moreover, it enables repetitive exposures of the same sample without altering the specimen properties.
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