Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

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Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

Shard, A. G. (author): National Physical Laboratory, Teddington, Middlesex TW11 0LW, United Kingdom

Havelund, R. (author): National Physical Laboratory, Teddington, Middlesex TW11 0LW, United Kingdom

Fletcher, John S. (author): Gothenburg University,Göteborgs universitet,Institutionen för kemi och molekylärbiologi,Department of Chemistry and Molecular Biology,Departmentof Chemistry and Molecular Biology, University of Gothenburg, Gothenburg 40530, Sweden

Gilmore, I. S. (author): National Physical Laboratory, Teddington, Middlesex TW11 0LW, United Kingdom

Alexander, M. R. (author): Laboratoryof Biophysics and Surface Analysis, University of Nottingham, Nottingham NG7 2RD, United Kingdom

Angerer, Tina B., 1987 (author): Gothenburg University,Göteborgs universitet,Institutionen för kemi och molekylärbiologi,Department of Chemistry and Molecular Biology,University of Gothenburg,Departmentof Chemistry and Molecular Biology, University of Gothenburg, Gothenburg 40530, Sweden

Aoyagi, S. (author): Departmentof Materials and Life Science, Seikei University, Tokyo 180-8633, Japan

Barnes, J. P. (author): Université Grenoble Alpes, F-38000 Grenoble, France;CEA, LETI, MINATEC Campus, F-38054 Grenoble, France

Benayad, A. (author): Université Grenoble Alpes, F-38000 Grenoble, France;CEA-LITEN/DTNM, F-38054 Grenoble, France

Bernasik, A. (author): AGH University of Science and Technology, Al. Mickiewicza 30, 30-059 Kraków, Poland

Ceccone, G. (author): Institute for Health and Consumer Protection, Via E. Fermi 2749, TP125, 21027 Ispra (VA), Italy

Counsell, J. D. P. (author): Kratos Analytical Ltd, Wharfside, Trafford Wharf Road, Manchester M17 1GP, United Kingdom

Deeks, C. (author): Thermo Fisher Scientific, EastGrinstead, West Sussex RH19 1UB, United Kingdom

Fletcher, John S. (author): Gothenburg University,Göteborgs universitet,Institutionen för kemi och molekylärbiologi,Department of Chemistry and Molecular Biology,University of Gothenburg

Graham, D. J. (author): Departmentof Bioengineering, University of Washington, Seattle, Washington 98195, United States

Heuser, C. (author): Facultyof Physics, University Duisburg-Essen, Lotharstraße 1, 47048 Duisburg, Germany

Lee, T. G. (author): Korea Research Institute of Standards and Science, 267 Gajeong-ro, Yuseong-gu, Daejeon 305-340, Republic of Korea

Marie, C. (author): Université Grenoble Alpes, F-38000 Grenoble, France;CEA, LETI, MINATEC Campus, F-38054 Grenoble, France

Marzec, M. M. (author): AGH University of Science and Technology, Al. Mickiewicza 30, 30-059 Kraków, Poland

Mishra, G. (author): CorporateResearch Analytical Laboratory (CRAL), 3M Deutschland GmbH, Carl-Schurz-Straße1, Neuss 41460, Germany

Rading, D. (author): ION-TOF GmbH, Heisenberg Straße15, D-48149 Münster, Germany

Renault, O. (author): Université Grenoble Alpes, F-38000 Grenoble, France;CEA, LETI, MINATEC Campus, F-38054 Grenoble, France

Scurr, D. J. (author): Laboratoryof Biophysics and Surface Analysis, University of Nottingham, Nottingham NG7 2RD, United Kingdom

Shon, H. K. (author): Korea Research Institute of Standards and Science, 267 Gajeong-ro, Yuseong-gu, Daejeon 305-340, Republic of Korea

Spampinato, V. (author): Istituto di Fisica dei Plasmi, Consiglio Nazionale delle Ricerche, Via R. Cozzi 53, 20125 Milano, Italy

Tian, H. (author): Pennsylvania State University, 104 Chemistry Building, University Park, Pennsylvania 16802, United States

Wang, F. Y. (author): CASKey Laboratory of Analytical Chemistry for Living Biosystems, Chinese Academy of Sciences, Beijing 100190, China

Winograd, N. (author): Pennsylvania State University, 104 Chemistry Building, University Park, Pennsylvania 16802, United States

Wu, K. (author): CASKey Laboratory of Analytical Chemistry for Living Biosystems, Chinese Academy of Sciences, Beijing 100190, China

Wucher, A. (author): Facultyof Physics, University Duisburg-Essen, Lotharstraße 1, 47048 Duisburg, Germany

Zhou, Y. F. (author): EMSL, Pacific Northwest National Laboratory, Richland, Washington 99354, United States

Zhu, Z. H. (author): EMSL, Pacific Northwest National Laboratory, Richland, Washington 99354, United States

Spencer, Steve J. (author): National Physical Laboratory, Teddington, Middlesex TW11 0LW, United Kingdom

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2015-08-06
2015
English.
In: Journal of Physical Chemistry B. - : American Chemical Society (ACS). - 1520-6106 .- 1520-5207. ; 119:33, s. 10784-10797

Related links:: http://dx.doi.org/10...; show more...; https://gup.ub.gu.se...; https://doi.org/10.1...; https://research.cha...; https://urn.kb.se/re...; show less...

Journal article (peer-reviewed)

Abstract Subject headings

We report the results of a VAMAS (Versailles Project on Advanced Materials and Standards) interlaboratory study on the measurement of composition in organic depth profiling. Layered samples with known binary compositions of Irganox 1010 and either Irganox 1098 or Fmoc-pentafluoro-L-phenylalanine in each layer were manufactured in a single batch and distributed to more than 20 participating laboratories. The samples were analyzed using argon cluster ion sputtering and either X-ray photoelectron spectroscopy (XPS) or time-of-flight secondary ion mass spectrometry (ToF-SIMS) to generate depth profiles. Participants were asked to estimate the volume fractions in two of the layers and were provided with the compositions of all other layers. Participants using XPS provided volume fractions within 0.03 of the nominal values. Participants using ToF-SIMS either made no attempt, or used various methods that gave results ranging in error from 0.02 to over 0.10 in volume fraction, the latter representing a 50% relative error for a nominal volume fraction of 0.2. Error was predominantly caused by inadequacy in the ability to compensate for primary ion intensity variations and the matrix effect in SIMS. Matrix effects in these materials appear to be more pronounced as the number of atoms in both the primary analytical ion and the secondary ion increase. Using the participants' data we show that organic SIMS matrix effects can be measured and are remarkably consistent between instruments. We provide recommendations for identifying and compensating for matrix effects. Finally, we demonstrate, using a simple normalization method, that virtually all ToF-SIMS participants could have obtained estimates of volume fraction that were at least as accurate and consistent as XPS.

Subject headings

NATURVETENSKAP -- Kemi -- Analytisk kemi (hsv//swe)
NATURAL SCIENCES -- Chemical Sciences -- Analytical Chemistry (hsv//eng)

Keyword

ION MASS-SPECTROMETRY
CLUSTER SPUTTERING YIELDS
UNIVERSAL EQUATION
SIZE-DEPENDENCE
TOF-SIMS
BEAMS
FILMS
SUPPRESSION
EFFICIENCY
EMISSION
Chemistry
Physical
SIZE-DEPENDENCE

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NATURAL SCIENCES: NATURAL SCIENCES; and Chemical Science ...; and Analytical Chemi ...

Articles in the publication: Journal of Physi ...

By the university: University of Gothenburg; Chalmers University of Technology; Uppsala University

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