| 1. |
- Lansåker, Pia, et al.
(författare)
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Spectral density analysis of thin gold films : Thickness and structure dependence of the optical properties
- 2013
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Ingår i: Proceedings. - Stockholm : The Electromagnetics Academy. - 0351-6067. ; , s. 443-447, s. 443-447
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Recension (övrigt vetenskapligt/konstnärligt)abstract
- In this paper we study the feasibility of representing the optical properties of ultrathin gold films by effective medium theories. Gold films with mass thicknesses in the range of 1.4 to 9.2 nm were deposited by DC magnetron sputtering onto non-heated glass substrates. Optical measurements in the range 0.25 to 2 µm were carried out by spectroscopic ellipsometry, and the effective complex dielectric function of each film was determined. The gold films were modelled as a mixture of gold and air, and a general effective medium description using the spectral density function (SDF) was used to describe their optical properties. Numerical inversion of the experimental dielectric function gave a broad and rather featureless SDF with a few superimposed peak structures, both for island structures and percolating films. The broad background is qualitatively similar to the predictions of the Bruggeman [Ann. Phys. (Leipzig), 5th series, 24 (1935) 636-679] model.
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| 2. |
- Valyukh, Iryna, et al.
(författare)
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Ellipsometrically determined optical properties of nickel-containing tungsten oxide thin films : Nanostructure inferred from effective medium theory
- 2012
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Ingår i: Journal of Applied Physics. - : AIP Publishing. - 0021-8979 .- 1089-7550. ; 112:4, s. 044308-
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Tidskriftsartikel (refereegranskat)abstract
- Films of NixW1−x oxide with 0.05 ≤ x ≤ 0.53 were produced by reactive dc magnetron co-sputtering onto Si. Such films have documented electrochromism. Spectroscopic ellipsometry was used to extract accurate data on the dielectric function in the photon range 0.062 to 5.62 eV. The results for 0.62 to 5.62 eV were compared with computations from the Bruggeman effective medium theory applied to two nanostructural models: one representing a random mixture of structural entities characterized by the dielectric functions of WO3 and NiWO4 and the other describing a random mixture of WO3 and NiO. Unambiguous evidence was found in favor of the former model, and hence the films are composed of nanosized tungsten oxide and nickel tungstate. This agrees excellently with an earlier investigation of ours on NixW1−x oxide films, where nanostructure was inferred from Raman spectroscopy, x-ray photoelectron spectroscopy, and x-ray diffraction.
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| 3. |
- Valyukh, Iryna, 1972-
(författare)
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Optical Characterization and Optimization of Display Components : Some Applications to Liquid-Crystal-Based and Electrochromics-Based Devices
- 2009
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Doktorsavhandling (övrigt vetenskapligt/konstnärligt)abstract
- This dissertation is focused on theoretical and experimental studies of optical properties of materials and multilayer structures composing liquid crystal displays (LCDs) and electrochromic (EC) devices. By applying spectroscopic ellipsometry, we have determined the optical constants of thin films of electrochromic tungsten oxide (WOx) and nickel oxide (NiOy), the films’ thickness and roughness. These films, which were obtained at spattering conditions possess high transmittance that is important for achieving good visibility and high contrast in an EC device. Another application of the general spectroscopic ellipsometry relates to the study of a photo-alignment layer of a mixture of azo-dyes SD-1 and SDA-2. We have found the optical constants of this mixture before and after illuminating it by polarized UV light. The results obtained confirm the diffusion model to explain the formation of the photo-induced order in azo-dye films. We have developed new techniques for fast characterization of twisted nematic LC cells in transmissive and reflective modes. Our techniques are based on the characteristics functions that we have introduced for determination of parameters of non-uniform birefringent media. These characteristic functions are found by simple procedures and can be utilised for simultaneous determination of retardation, its wavelength dispersion, and twist angle, as well as for solving associated optimization problems. Cholesteric LCD that possesses some unique properties, such as bistability and good selective scattering, however, has a disadvantage – relatively high driving voltage (tens of volts). The way we propose to reduce the driving voltage consists of applying a stack of thin (~1µm) LC layers. We have studied the ability of a layer of a surface stabilized ferroelectric liquid crystal coupled with several retardation plates for birefringent color generation. We have demonstrated that in order to accomplish good color characteristics and high brightness of the display, one or two retardation plates are sufficient.
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| 4. |
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| 5. |
- Valyukh, Iryna, et al.
(författare)
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Optical properties of thin films of mixed Ni-W oxide made by reactive DC magnetron sputtering
- 2011
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Ingår i: Thin Solid Films. - : Elsevier BV. - 0040-6090 .- 1879-2731. ; 519:9, s. 2914-2918
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Tidskriftsartikel (refereegranskat)abstract
- Thin films of NixW1-x oxides with x = 0.05, 0.19, 0.43 and 0.90 were studied. Films with thicknesses in the range 125-250 nm were deposited on silicon wafers at room temperature by reactive DC magnetron co-sputtering from targets of Ni and W. The films were characterized with X-ray diffraction (XRD), scanning electron microscopy (SEM), and spectroscopic ellipsometry (SE). XRD spectra and SEM micrographs showed that all films were amorphous and possessed a columnar structure. The ellipsometric angles psi and Delta of as-deposited films were measured by a rotating analyzer ellipsometer in the UV-visible-near infrared range (0.63-6.18 eV) and by an infrared Fourier transform rotating compensator ellipsometer in the 500-5200 cm(-1) wavenumber range. SE measurements were performed at angles of incidence of from 50 degrees to 70 degrees. Parametric models were used to extract thicknesses of the thin films and overlayers of NixW1-x oxide at different compositions, band gaps and optical constants. Features in the optical spectra of the NixW1-x oxides were compared with previous data on tungsten oxide, nickel oxide and nickel tungstate.
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| 6. |
- Valyukh, Iryna, 1972-, et al.
(författare)
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Spectroscopic ellipsometry characterization of electrochromic tungsten oxide and nickel oxide thin films made by sputter deposition
- 2010
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Ingår i: Solar Energy Materials and Solar Cells. - : Elsevier BV. - 0927-0248 .- 1879-3398. ; 94:5, s. 724-732
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Tidskriftsartikel (refereegranskat)abstract
- Electrochromic films of tungsten oxide and nickel oxide were made by reactive dc magnetron sputtering and were characterized by X-ray diffraction, Rutherford backscattering spectrometry, scanning electron microscopy, and atomic force microscopy. The optical properties were investigated in detail by spectroscopic ellipsometry and spectrophotometry, using a multiple-sample approach. The W oxide film was modeled as a homogeneous isotropic layer, whereas the Ni oxide film was modeled as an anisotropic layer with the optical axis perpendicular to the surface. Parametric models of the two layers were then used to derive complex refractive index in the 300-1700-nm-range, film thickness, and surface roughness. A band gap of 3.15 eV was found for the W oxide film, using a Tauc-Lorentz parameterization. For the Ni oxide film, taken to have direct optical transitions, band gaps along the optical axis, perpendicular to it, and in an isotropic intermediate layer at the bottom of the film were found to be 3.95, 3.97, and 3.63 eV, respectively. Parameterization for the Ni oxide was made by use of the Lorentz model.
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