| 1. |
- Magnus, Fridrik, et al.
(author)
-
Giant magnetic domains in amorphous SmCo thin films
- 2014
-
In: Physical Review B. Condensed Matter and Materials Physics. - 1098-0121 .- 1550-235X. ; 89:22, s. 224420-1-224420-5
-
Journal article (peer-reviewed)abstract
- The potential for tuning of magnetic properties and the exceptional uniformity are among the features that make amorphous magnetic materials attractive for technology. Here it is shown that the magnetization reversal in amorphous SmCo thin films takes place through the formation of giant magnetic domains, over a centimeter across. The domain structure is found to be dictated by the direction of the imprinted in-plane easy axis and the film boundaries. This is a consequence of the size of the anisotropy and the structural uniformity of the films, which also allows the movement of millimeter-long domain walls over distances of several millimeters. The results demonstrate the possibility of tailoring the magnetic domain structure in amorphous magnets over a wide range of length scales, up to centimeters. Moreover, they highlight an important consequence of the structural perfection of amorphous films.
|
|
| 2. |
- Moubah, Reda, et al.
(author)
-
Tailoring magnetism at the nanometer scale in SmCo5 amorphous films
- 2013
-
In: Journal of Physics. - : IOP Publishing. - 0953-8984 .- 1361-648X. ; 25:41, s. 416004-
-
Journal article (peer-reviewed)abstract
- The thickness dependence of magnetic properties has been studied in SmCo5 amorphous films with imprinted in-plane anisotropy for thicknesses ranging down to the nanometer scale (2.5-100 nm). The field induced in-plane magnetic anisotropy decreases considerably when the film thickness is below 20 nm. Analysis of the magnetic anisotropy energy shows that the decrease of the induced in-plane anisotropy is accompanied by the development of an out-of-plane interface anisotropy. Two different regimes for the coercivity (H-c) change are found: below 3.75 nm, the H-c decreases continuously with decrease of the film thickness, whereas at above 3.75 nm, the H-c decreases with increase of the film thickness. This change in Hc can be understood by considering the decrease of the short range chemical order for the thinnest films (<3.75 nm) and the relative decrease of the interface contribution with increasing film thickness. The changes in anisotropy have a profound influence on the domain structure, in which the angle of the zigzag domain boundaries decreases with the inverse thickness of the layers.
|
|
