| 1. |
- Tholander, Christopher, et al.
(författare)
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Ab initio calculations and experimental study of piezoelectric YxIn1-xN thin films deposited using reactive magnetron sputter epitaxy
- 2016
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Ingår i: Acta Materialia. - : Elsevier. - 1359-6454 .- 1873-2453. ; 105, s. 199-206
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Tidskriftsartikel (refereegranskat)abstract
- By combining theoretical prediction and experimental verification we investigate the piezoelectric properties of yttrium indium nitride (YxIn1-xN). Ab initio calculations show that the YxIn1-xN wurtzite phase is lowest in energy among relevant alloy structures for 0≤x≤0.5. Reactive magnetron sputter epitaxy was used to prepare thin films with Y content up to x=0.51. The composition dependence of the lattice parameters observed in the grown films is in agreement with that predicted by the theoretical calculations confirming the possibility to synthesize a wurtzite solid solution. An AlN buffer layer greatly improves the crystalline quality and surface morphology of subsequently grown YxIn1-xN films. The piezoelectric response in films with x=0.09 and x=0.14 is observed using piezoresponse force microscopy. Theoretical calculations of the piezoelectric properties predict YxIn1−xN to have comparable piezoelectric properties to ScxAl1-xN.
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| 2. |
- Žukauskaitė, Agnė, et al.
(författare)
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Stabilization of Wurtzite Sc0.4Al0.6N in Pseudomorphic Epitaxial ScxAl1-xN/InyAl1-yN Superlattices
- 2015
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Ingår i: Acta Materialia. - : Elsevier. - 1359-6454 .- 1873-2453. ; 94, s. 101-110
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Tidskriftsartikel (refereegranskat)abstract
- Pseudomorphic stabilization in wurtzite ScxAl1-xN/AlN and ScxAl1-xN/InyAl1-yN superlattices (x=0.2, 0.3, and 0.4; y=0.2-0.72), grown by reactive magnetron sputter epitaxy was investigated. X-ray diffraction and transmission electron microscopy show that in ScxAl1-xN/AlN superlattices the compressive biaxial stresses due to positive lattice mismatch in Sc0.3Al0.7N and Sc0.4Al0.6N lead to loss of epitaxy, although the structure remains layered. For the negative lattice mismatched In-rich ScxAl1-xN/InyAl1-yN superlattices a tensile biaxial stress promotes the stabilization of wurtzite ScxAl1-xN even for the highest investigated concentration x=0.4. Ab initio calculations with fixed in-plane lattice parameters show a reduction in mixing energy for wurtzite ScxAl1-xN under tensile stress when x≥0.375 and support the experimental results.
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| 3. |
- Žukauskaitė, Agnė, et al.
(författare)
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YxAl1-xN Thin Films
- 2012
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Ingår i: Journal of Physics D. - : Institute of Physics Publishing (IOPP). - 0022-3727 .- 1361-6463. ; 45:42, s. 422001-
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Tidskriftsartikel (refereegranskat)abstract
- Reactive magnetron sputtering was used to deposit YxAl1-xN thin films, 0≤x≤0.22, onto Al2O3(0001) and Si(100) substrates. X-ray diffraction and analytical electron microscopy show that the films are solid solutions. Lattice constants are increasing with Y concentration, in agreement with ab initio calculations. Spectroscopic ellipsometry measurements reveal a band gap decrease from 6.2 eV (x=0) down to 4.9 eV (x=0.22). Theoretical investigations within the special quasirandom structure approach show that the wurtzite structure has the lowest mixingenthalpy for 0≤x≤0.75.
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