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- Andersson, Cristina, 1969, et al.
(författare)
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Tensile properties and microstructural characterization of Sn-0.7Cu-0.4Co bulk solder alloy for electronics applications
- 2008
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Ingår i: Journal of Alloys and Compounds. - : Elsevier BV. - 0925-8388. ; 457:1/2, s. 97-105
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Tidskriftsartikel (refereegranskat)abstract
- The ternary Sn–Cu–Co system eutectic composition was obtained by means of CALPHAD (CALculation of PHAse Diagram) methodology and it was found to be 0.4% Co and 0.7% Cu (wt%) with a melting point of 224 ◦C. The tensile behavior of this alloy was investigated at different strain rates (10−5, 10−4 and 10−3 s−1) and compared to both Sn–37Pb and Sn–4.0Ag–0.5Cu. The Sn–4.0Ag–0.5Cu alloy depicts the highest ultimate tensile strength (UTS) followed by the Sn–37P and finally the Sn–0.7Cu–0.4Co system. The elastic modulus was also higher for the Sn–4.0Ag–0.5Cu followed by the Sn–0.7Cu–0.4Co and last the Sn–37Pb. The microstructure of the Sn–0.7Cu–0.4Co alloy is composed of two types of intermetallic phases, (Cu,Co)6Sn5 and (Co,Cu)Sn2 dispersed in a Sn-rich matrix. The microstructure of this alloy proved to be very stable, after aging at 150 °C for 24 h. The eutectic Sn–0.7Cu–0.4Co solder alloy can therefore be a very good alternative for theSACalloys for surface mount technology applications.
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| 2. |
- Andersson, Cristina, 1969, et al.
(författare)
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Thermal cycling of lead-free Sn-3.8Ag-0.7Cu 388PBGA packages
- 2009
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Ingår i: Soldering and Surface Mount Technology. - : Emerald. - 1758-6836 .- 0954-0911. ; 21:2, s. 28-38
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Tidskriftsartikel (refereegranskat)abstract
- Purpose - The purpose of this paper is to assess the effect of different temperature cycling profiles on the reliability of lead-free 388 plastic ball grid array (PBGA) packages and to deeply understand crack initiation and propagation.Design/methodology/approach - Temperature cycling of Sn-3.8Ag-0.7Cu PBGA packages was carried out at two temperature profiles, the first ranging between - 55 degrees C and 100 degrees C (TC1) and the second between 0 degrees C and 100 degrees C (TC2). Crack initiation and propagation was analyzed periodically and totally 7,000 cycles were run for TO and 14,500 for TC2. Finite element modeling (FEM), for the analysis of strain and stress, was used to corroborate the experimental results.Findings - The paper finds that TC1 had a characteristic life of 5,415 cycles and TC2 of 14,094 cycles, resulting in an acceleration factor of 2.6 between both profiles. Cracks were first visible for TC1, after 2,500 cycles, and only after 4,000 cycles for TC2. The crack propagation rate was faster for TC1 compared to TC2, and faster at the package side compared to the substrate side. The difference in crack propagation rate between the package side and substrate side was much larger for TC1 compared to TC2. Cracks developed first at the package side, and were also larger compared to the substrate side. The Cu tracks on the substrate side affected the crack propagation sites and behaved as SMD. All cracks propagated through the solder and crack propagation was mainly intergranular. Crack propagation was very random and did not follow the distance to neutral point (DNP) theory. FEM corroborated the experimental results, showing both the same critical location of highest creep strain and the independence of DNP.Originality/value - Such extensive work on the reliability assessment of Pb-free 388 PBGA packages has never been performed. This work also corroborates the results from other studies showing the difference in behavior between Pb-free and Pb-containing alloys.
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| 3. |
- Bailey, C., et al.
(författare)
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Coffin-Manson constant determination for a Sn-8Zn-3Bi Lead-Free Solder Joint
- 2006
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Ingår i: Soldering and Surface Mount Technology. - : Emerald. - 1758-6836 .- 0954-0911. ; 18:2, s. 4-11
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Tidskriftsartikel (refereegranskat)abstract
- Purpose To determine the Coffin-Manson (CM) equation constants for fatigue life estimation of Sn-8Zn-3Bi solder joints, since Sn-8Zn-3Bi solder has a melting temperature of around 199°C which is close to that of the conventional Sn-Pb solder which has previously been used in the electronics assembly industry. Design/methodology/approach Three dimensional finite element (FE) simulation analysis was used for comparison with the experimentally measured data and to determine the CM constants. Low cycle fatigue tests and FE simulations were carried out for these lead-free solder joints, and eutectic Sn-37Pb solder was used as a reference. Findings The CM equation for Sn-8Zn-3Bi solder joints was fitted to the lifetimes measured and the shear strains simulated. The constants were determined to be 0.0294 for C, the proportional constant, and for the fatigue exponent, β, −2.833. Originality/value The CM equation can now be used to predict the reliability of Sn-8Zn-3Bi solder joints in electronics assembly and the knowledge base for the properties of the Sn-Zn solder system has been increased.
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| 4. |
- Chen, S., et al.
(författare)
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Coffin-Mansson equation of Sn-4.0Ag-0.5Cu solder joint
- 2009
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Ingår i: Soldering and Surface Mount Technology. - : Emerald. - 1758-6836 .- 0954-0911. ; 21:2, s. 48-54
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Tidskriftsartikel (refereegranskat)abstract
- Purpose: The purpose of this paper is to fit Coffin-Manson equation of Sn-4.0Ag-0.5Cu lead free solder joint by using results of solders joint reliability test and finite element analysis. Also to present a novel device for solder joint reliability test. Design/methodology/approach: Two-points bending test of Sn-4.0Ag-0.5Cu lead free solder joint was carried out at three deflection levels by using a special bending tester that can control displacement exactly by a cam system. The failure criterion was defined as resistance of solder joint getting 10 percent increase. The X-section was done for all failure samples to observe crack initiation and propagation in solder joint. Finite element analysis was presented with ANSYS for obtaining shear strain range, analyzing distribution of stress and strain and supporting experimental results. Findings: The experimental results indicate that the fatigue life decreased obviously with the displacement increased. By using optical microscope and SEM photographs, two kinds of failure mode were found in solder joint. The majority failure mode took place at the bottom corner of solder joint under the termination of resistor initially, and propagated into the solder matrix. Another failure mode was delamination. It appeared at the interface between the termination of resistor and its ceramic body. The distribution status of stress and strain in solder joint and the calculation results of shear strain range at different deflection levels were obtained from simulation result. The Coffin-Manson equation of Sn-4.0Ag-0.5Cu lead free solder joint was fitted by combining experimental data with result of finite element analysis. Originality/value: This paper presents Coffin-Manson equation of Sn-4.0Ag-0.5Cu solder joint with two-points bending test. An effective and economical device was designed and applied.
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| 10. |
- Sun, Peng, 1979, et al.
(författare)
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High temperature aging study of intermetallic compound formation of Sn-3,5Ag and Sn-4.0Ag-0,5Cu solders on electroless Ni(P) metallization
- 2006
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Ingår i: Journal of Alloys and Compounds. - : Elsevier BV. - 0925-8388. ; 425:1-2, s. 191-199
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Tidskriftsartikel (refereegranskat)abstract
- The Sn-3.5Ag and Sn-4.0Ag-0.5Cu solders on Au/electroless Ni(P) metallization exhibited different interfacial morphologies after high temperature storage (HTS) at 150 °C. Ni 3 Sn 4 intermetallic compounds (IMCs) were found in the Sn-Ag system, while for the Sn-Ag-Cu system the IMCs consisted of two kinds of interfacial reactions. For the Sn-3.5Ag solder, the Ni 3 Sn 4 IMC particles lost adhesion/contact to the electroless Ni(P) layer and clear gap was observed in the samples after high temperature storage (HTS) aging for 1000 h. In the Sn-4.0Ag-0.5Cu solder joint, both (Cu,Ni) 6 Sn 5 and (Ni,Cu) 3 Sn 4 compounds were observed after HTS aging. Since the difference in nucleation site and growth rate for kinds of IMCs, (Cu,Ni) 6 Sn 5 was observed at top and (Ni,Cu) 3 Sn 4 at bottom when the interfacial compound layer became thicker as a function of thermal aging. Some voids were found between the electroless Ni(P) interface and the Sn-Ag solder after 168 and 500 h of thermal aging, while the clear gap between the solder and the Ni layer existed after 1000 h aging. The formation mechanism for this gap could be the interconnection and growth of the voids. In the Sn-Ag-Cu system, voids were found inside the Sn-Ni-Cu ternary interfacial compounds after 500 and 1000 h. The formation mechanism for these voids was thought to be Kirkendall effect or etching process. The interfacial layer of Sn-Ag-Cu solder on electroless Ni(P) coating showed the better thermal stable than eutectic Sn-Ag solder. © 2006 Elsevier B.V. All rights reserved.
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