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Träfflista för sökning "WFRF:(Wallin Lars) ;pers:(Samuelson Lars)"

Sökning: WFRF:(Wallin Lars) > Samuelson Lars

  • Resultat 1-10 av 12
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1.
  • Maximov, Ivan, et al. (författare)
  • Nanoimprint lithography for fabrication of three-terminal ballistic junctions in InP/GaInAs
  • 2002
  • Ingår i: Nanotechnology. - : IOP Publishing. - 0957-4484. ; 13:5, s. 666-668
  • Tidskriftsartikel (refereegranskat)abstract
    • We present processing technology and characterization results for InP/GaInAs two-dimensional electron gas (2DEG) three-terminal ballistic junction (TBJ) devices manufactured using nanoimprint lithography (NIL). To transfer sub-100 nm features into a high-mobility InP-based 2DEG material, we used SiO2/Si stamps made using electron beam lithography and reactive ion etching. After NIL, the resist residues are removed in oxygen plasma; this is followed by wet etching of InP/GaInAs to define the TBJ structures. Fabricated TBJ devices are characterized using scanning electron microscopy and electron transport measurements. Highly non-linear electrical characteristics as predicted by the theory (Xu H Q 2001 APPI. Phys. Lett. 78 2064) are demonstrated.
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2.
  • Maximov, Ivan, et al. (författare)
  • Nanoimprint technology for fabrication of three-terminal ballistic junction devices in GaInAs/InP
  • 2003
  • Ingår i: Microelectronic Engineering. - 1873-5568. ; 67-8, s. 196-202
  • Tidskriftsartikel (refereegranskat)abstract
    • We present processing technology based on nanoimprint lithography (NIL) and wet etching for fabrication of GaInAs/InP three-terminal ballistic junction (TBJ) devices. To transfer sub-100 nm features into a high-mobility InP-based 2DEG material, we used SiO2/Si stamps made with electron beam lithography and reactive ion etching. After the NIL, the resist residues are removed in oxygen plasma followed by wet etching of GaInAs/InP to define the M-structures. Fabricated TBJ-devices are characterized using scanning electron microscopy and electron transport measurements. Highly non-linear electrical characteristics of the TBJ structures are demonstrated and compared with E-beam defined devices. (C) 2003 Elsevier Science B.V. All rights reserved.
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3.
  • Balocco, C, et al. (författare)
  • Microwave detection at 110 GHz by nanowires with broken symmetry
  • 2005
  • Ingår i: Nano Letters. - : American Chemical Society (ACS). - 1530-6992 .- 1530-6984. ; 5:7, s. 1423-1427
  • Tidskriftsartikel (refereegranskat)abstract
    • By using arrays of nanowires with intentionally broken symmetry, we were able to detect microwaves up to 110 GHz at room temperature. This is, to the best of our knowledge, the highest speed that has been demonstrated in different types of novel electronic nanostructures to date. Our experiments showed a rather stable detection sensitivity over a broad frequency range from 100 MHz to 110 GHz. The novel working principle enabled the nanowires to detect microwaves efficiently without a dc bias. In principle, the need for only one high-resolution lithography step and the planar architecture allow an arbitrary number of nanowires to be made by folding a linear array as many times as required over a large area, for example, a whole wafer. Our experiment on 18 parallel nanowires showed a sensitivity of approximately 75 mV dc output/mW of nominal input power of the 110 GHz signal, even though only about 0.4% of the rf power was effectively applied to the structure because of an impedance mismatch. Because this array of nanowires operates simultaneously, low detection noise was achieved, allowing us to detect -25 dBm 110 GHz microwaves at zero bias with a standard setup.
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4.
  • Larsson, Magnus, et al. (författare)
  • Strain mapping in free-standing heterostructured wurtzite InAs/InP nanowires
  • 2007
  • Ingår i: Nanotechnology. - : IOP Publishing. - 0957-4484 .- 1361-6528. ; 18:1
  • Tidskriftsartikel (refereegranskat)abstract
    • The strain distribution in heterostructured wurtzite InAs/InP nanowires is measured by a peak finding technique using high resolution transmission electron microscopy images. We find that nanowires with a diameter of about 20 nm show a 10 nm strained area over the InAs/InP interface and the rest of the wire has a relaxed lattice structure. The lattice parameters and elastic properties for the wurtzite structure of InAs and InP are calculated and a nanowire interface is simulated using finite element calculations. Both the method and the experimental results are validated using a combination of finite element calculations and image simulations.
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6.
  • Suyatin, Dmitry, et al. (författare)
  • Electrical properties of self-assembled branched InAs nanowire junctions
  • 2008
  • Ingår i: Nano Letters. - : American Chemical Society (ACS). - 1530-6992 .- 1530-6984. ; 8:4, s. 1100-1104
  • Tidskriftsartikel (refereegranskat)abstract
    • We investigate electrical properties of self-assembled branched InAs nanowires. The branched nanowires are catalytically grown using chemical beam epitaxy, and three-terminal nanoelectronic devices are fabricated from the branched nanowires using electron-beam lithography. We demonstrate that, in difference from conventional macroscopic junctions, the fabricated self-assembled nanowire junction devices exhibit tunable nonlinear electrical characteristics and a signature of ballistic electron transport. As an example of applications, we demonstrate that the self-assembled three-terminal nanowire junctions can be used to implement the functions of frequency mixing, multiplication, and phase-difference detection of input electrical signals at room temperature. Our results suggest a wide range of potential applications of branched semiconductor nanostructures in nanoelectronics.
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9.
  • Wallin, Daniel, et al. (författare)
  • Detection of charge states in nanowire quantum dots using a quantum point contact
  • 2007
  • Ingår i: Applied Physics Letters. - : AIP Publishing. - 0003-6951 .- 1077-3118. ; 90
  • Tidskriftsartikel (refereegranskat)abstract
    • The authors demonstrate operation of a charge readout scheme for quantum dots in a semiconductor nanowire using a quantum point contact defined in a GaAs/AlGaAs two-dimensional electron gas beneath the nanowire. The quantum dots were fabricated by epitaxial growth of InP barriers along a n-type InAs nanowire. Applying negative voltages to two split-gate electrodes aligned to the nanowire induces a quantum point contact in the two-dimensional electron gas such that charging of quantum dots in the nanowire modulates the quantum point contact transmission, thus resulting in the desired detector response.
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