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A new procedure for extraction of series resistances for bipolar transistors from DC measurements

Linder, Martin (author)
Ingvarson, Fredrik, 1972 (author)
Chalmers tekniska högskola,Chalmers University of Technology
Jeppson, Kjell, 1947 (author)
Chalmers tekniska högskola,Chalmers University of Technology
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Grahn, Jan (author)
Zhang, Shi-Li (author)
Östling, Mikael (author)
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 (creator_code:org_t)
1999
1999
English.
In: Proceedings of the 1999 IEEE International Conference on Microelectronic Test Structures. ; , s. 147-151
  • Conference paper (peer-reviewed)
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TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

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Linder, Martin
Ingvarson, Fredr ...
Jeppson, Kjell, ...
Grahn, Jan
Zhang, Shi-Li
Östling, Mikael
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ENGINEERING AND TECHNOLOGY
ENGINEERING AND ...
and Electrical Engin ...
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Chalmers University of Technology

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