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Träfflista för sökning "WFRF:(Janzén Erik 1954 ) ;pers:(Ohshima T.)"

Sökning: WFRF:(Janzén Erik 1954 ) > Ohshima T.

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1.
  • Carlsson, Patrick, 1975-, et al. (författare)
  • Electron paramagnetic resonance study on n-type electron-irradiated 3C-SiC
  • 2008
  • Ingår i: PROCEEDINGS OF THE 17TH INTERNATIONAL VACUUM CONGRESS/13TH INTERNATIONAL CONFERENCE ON SURFACE SCIENCE/INTERNATIONAL CONFERENCE ON NANOSCIENCE AND TECHNOLOGY. - BRISTOL, ENGLAND : IOP PUBLISHING LTD.
  • Konferensbidrag (refereegranskat)abstract
    • Electron Paramagnetic Resonance (EPR) was used to study defects in n-type 3C-SiC films irradiated by 3-MeV electrons at room temperature with a dose of 2x10(18) cm(-2). After electron irradiation, two new EPR spectra with an effective spin S = 1, labeled L5 and L6, were observed. The L5 center has C-3v symmetry with g = 2.004 and a fine-structure parameter D = 436.5 x 10(-4) cm(-1). The L5 spectrum was only detected under light illumination and it could not be detected after annealing at similar to 550 C. The principal z-axis of the D tensor is parallel to the < 111 >-directions, indicating the location of spins along the Si-C bonds. Judging from the symmetry and the fact that the signal was detected under illumination in n-type material, the L5 center may be related to the divacancy in the neutral charge state. The L6 center has a C-2v-symmetry with an isotropic g-value of g=2.003 and the fine structure parameters D=547.7 x 10(-4) cm-1 and E=56.2 x 10(-4) cm(-1). The L6 center disappeared after annealing at a rather low temperature (similar to 200 degrees C), which is substantially lower than the known annealing temperatures for vacancy-related defects in 3C-SiC. This highly mobile defect may be related to carbon interstitials.
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2.
  • Carlsson, Patrick, 1975-, et al. (författare)
  • Photo-EPR Studies on Low-Energy Electron-irradiated 4H-SiC
  • 2009
  • Ingår i: Materials Science Forum, Vols. 615-617. - Materials Science Forum Vols. 615-617 : Trans Tech Publications. - 978-087849334-0 ; s. 401-404
  • Konferensbidrag (refereegranskat)abstract
    • Photoexcitation electron paramagnetic resonance (photo-EPR) was used to determine deep levels related to the carbon vacancy (VC) in 4H-SiC. High-purity free-standing n-type 4H-SiC epilayers with concentration of intrinsic defects (except the photo-insensitive SI1 center) below the detection limit of EPR were irradiated with low-energy (200 keV) electrons to create mainly VC and defects related to the C sublattice. The simultaneous observation of and signals, their relative intensity changes and the absence of other defects in the sample provide a more straight and reliable interpretation of the photo-EPR results. The study suggests that the (+|0) level of VC is located at ~EC–1.77 eV in agreement with previously reported results and its single and double acceptor levels may be at ~ EC–0.8 eV and ~ EC–1.0 eV, respectively.
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4.
  • Isoya, J., et al. (författare)
  • EPR Identification of Defects and Impurities in SiC : To Be Decisive
  • 2009
  • Ingår i: Materials Science Forum, Vols. 600-603. - Trans Tech Publications. ; s. 279-284
  • Konferensbidrag (refereegranskat)abstract
    • In EPR (electron paramagnetic resonance) identification of point defects, hyperfine (HF) interaction is decisive information not only for chemical identity but also for the local geometry and the electronic state. In some intrinsic defects in SiC, the wave function of the unpaired electron extends quite unevenly among major atoms comprising the defects. In such a case, the determination of the number of equivalent atoms and the chemical identity (Si or C) of those atoms even with weak HF splitting are useful to compare with HF parameters obtained theoretically. For vacancy-related defects of relatively deep levels, the sum of the spin densities on the nearest-neighbor shell is found to be 60-68%.
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5.
  • Isoya, J., et al. (författare)
  • EPR identification of intrinsic defects in SiC
  • 2008
  • Ingår i: Physica status solidi. B, Basic research. - 0370-1972. ; 245:7, s. 1298-1314
  • Tidskriftsartikel (refereegranskat)abstract
    • The structure determination of intrinsic defects in 4H-SiC, 6H-SiC, and 3C-SiC by means of EPR is based on measuring the angular dependence of the 29Si/13C hyperfine (HF) satellite lines, from which spin densities, sp-hybrid ratio, and p-orbital direction can be determined over major atoms comprising a defect. In most cases, not only the assignment of the variety due to the inequivalent sites (h- and k-sites in 4H-SiC) but also the identification of the defect species is accomplished through the comparison of the obtained HF parameters with those obtained from first principles calculations. Our works of identifying vacancy-related defects such as the monovacancies, divacancies, and antisite-vacancy pairs in 4H-SiC are reviewed. In addition, it is demonstrated that the observation of the central line of the TV2a center of S = 3/2 has been achieved by pulsed-ELDOR. © 2008 Wiley-VCH Verlag GmbH & Co. KGaA.
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7.
  • Nguyen, Son Tien, 1953-, et al. (författare)
  • Defects introduced by electron-irradiation at low temperatures in SiC
  • 2009
  • Ingår i: Materials Science Forum Vols. 615-617. - Trans Tech Publicarions. - 978-087849334-0 ; s. 377-380
  • Konferensbidrag (refereegranskat)abstract
    • Defects introduced by electron irradiation at ~80-100 K in 3C-, 4H- and 6H-SiC were studied by electron paramagnetic resonance (EPR). A number of EPR spectra, labelled LE1-10, were detected. Combining EPR and supercell calculations, we will show that the LE1 center in 3C-SiC with C2v symmetry and an electron spin S=3/2 is related to the (VSi-Sii)3+ Frenkel pair between the silicon vacancy and a second neighbour Sii interstitial along the <100> direction. Results on other centers, possibly also related to interstitials, are discussed.
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8.
  • Nguyen, Son Tien, 1953-, et al. (författare)
  • Divacancy in 4H-SiC
  • 2006
  • Ingår i: Physical review letters / publ. by the American Physical Society. ; 96, s. 055501-1
  • Tidskriftsartikel (refereegranskat)
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10.
  • Nguyen, Son Tien, 1953-, et al. (författare)
  • Magnetic resonance studies of defects in electron-irradiated ZnO substrates
  • 2007
  • Ingår i: Physica. B, Condensed matter. - 0921-4526. ; 401-402, s. 507-510
  • Tidskriftsartikel (refereegranskat)abstract
    • Optical detection of magnetic resonance (ODMR) was used to study defects in electron-irradiated ZnO substrates. In addition to the shallow donor and the Zn vacancy, several ODMR centers with an effective electron spin <img src="http://ars.els-cdn.com/content/image/1-s2.0-S0921452607007685-si1.gif" data-loaded="true" data-inlimgeid="1-s2.0-S0921452607007685-si1.gif" /> were detected. Among these, the axial LU3 and non-axial LU4 centers are shown to be dominating recombination centers. The annealing behavior of radiation-induced defects was studied and possible defect models are discussed.
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