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Improved photoelect...
Improved photoelectrochemical performance of Cu(In,Ga)Se2 thin films prepared by pulsed electrodeposition
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Mandati, S. (författare)
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Sarada, B. V. (författare)
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Dey, S. R. (författare)
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visa fler...
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Joshi, S. V. (författare)
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visa färre...
- 2013
- 2013
- Engelska.
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Ingår i: Journal of Renewable and Sustainable Energy. - 1941-7012. ; 5
- Relaterad länk:
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https://urn.kb.se/re...
Abstract
Ämnesord
Stäng
- Solar cells based on polycrystalline Cu(In,Ga)Se2 absorber layers have yielded the highest conversion efficiency among all the thin-film technologies. CIGS thin-films possess large optical absorption coefficient (≈105 cm-1) and a suitable bandgap of ≈ 1.20 eV for an ideal stoichiometry of CuIn0.7Ga0.3Se2. In the present study, Direct Current (DC) and Pulsed Current (PC) electrodeposition techniques are employed to obtain the near ideal stoichiometric CIGS thin-films on a Mo foil using a two electrode system at a constant potential. Deposited films are annealed at 550 °C under Ar atmosphere. Characterization of the annealed CIGS films is performed using SEM-energy dispersive X-ray spectroscopy, X-ray diffraction, Raman spectroscopy, and photoelectrochemistry to study the morphology, stoichiometry, phase constitution, and the photoelectrochemical response. PC deposition offered suitable manipulation of various parameters, which has helped in obtaining a better quality stoichiometric single phase chalcopyrite structured CIGS thin films with the elimination of unwanted secondary phases like Cu2-xSe. An improved photoelectrochemical performance, characteristic of a p-type semiconductor, is observed for the PC deposited CIGS films. © 2013 AIP Publishing LLC.
Nyckelord
- Electrodeposition technique
- Optical absorption coefficients
- Photo-electrochemistry
- Photoelectrochemical performance
- Photoelectrochemical response
- Pulsed electrodeposition
- Thin-film technology
- Two-electrode systems
- Deposition
- Electrochemistry
- Electrodeposition
- Gallium
- Semiconducting selenium compounds
- Stoichiometry
- Thin films
- X ray diffraction
- X ray spectroscopy
- Copper
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