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Automatic generatio...
Automatic generation of breakpoint hardware for silicon debug
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Vermeulen, B. (författare)
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- Urfianto, Mohammad Z. (författare)
- KTH
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Goel, S. K. (författare)
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(creator_code:org_t)
- 2004-06-07
- 2004
- Engelska.
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Ingår i: Proceedings of the 41st Design Automation Conference. - New York, NY, USA : IEEE Computer Society. - 1581138288 ; , s. 514-517
- Relaterad länk:
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https://urn.kb.se/re...
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visa fler...
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https://doi.org/10.1...
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visa färre...
Abstract
Ämnesord
Stäng
- Scan-based silicon debug is a technique that can be used to help find design errors in prototype silicon more quickly. One part of this technique involves the inclusion of break-point modules during the design stage of the chip. This paper focuses on an innovative approach to automatically generate breakpoint modules by means of a breakpoint description language. This language is illustrated using an example, and experimental results are presented that show the efficiency and effectiveness of this new method for generating breakpoint hardware.
Ämnesord
- NATURVETENSKAP -- Data- och informationsvetenskap -- Annan data- och informationsvetenskap (hsv//swe)
- NATURAL SCIENCES -- Computer and Information Sciences -- Other Computer and Information Science (hsv//eng)
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Nyckelord
- Design
- Break-point description language (BDL)
- Performance analysis
- Scan-based silicon debug
- Computer aided design
- Computer aided software engineering
- Computer hardware
- Computer programming languages
- Computer simulation
- Program debugging
- Silicon
- Microprocessor chips
Publikations- och innehållstyp
- ref (ämneskategori)
- kon (ämneskategori)
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