Direct characterization of focusing light by negative refraction in a photonic crystal flat lens

• We report experimental measurements of the field distribution of the light spot focused by a two-dimensional photonic crystal flat lens at wavelengths 1.51-1.58 mu m. The photonic crystal slab is fabricated on a silicon-on-insulator substrate by focused-ion-beam direct milling. We confirm the light focusing by the photonic crystal slab through direct observation of the light spot entering into free space at the end facet of the slab lens. The beam profiles as the function of lateral position are measured and the minimal full width half maximum of the beam at 1.2 mu m (0.77 lambda) is obtained.

Ämnesord

NATURVETENSKAP  -- Fysik -- Atom- och molekylfysik och optik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences -- Atom and Molecular Physics and Optics (hsv//eng)

NATURVETENSKAP  -- Fysik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences (hsv//eng)

Nyckelord

focused ion beam technology

lenses

optical fabrication

optical

focusing

photonic crystals

refractive index

wave-guides

silicon

fabrication

slabs

Physics

Publikations- och innehållstyp

ref (ämneskategori)

art (ämneskategori)