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Absolute extreme ul...
Absolute extreme ultraviolet yield from femtosecond-laser-excited Xe clusters
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Ter-Avetisyan, S. (författare)
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Schnurer, M. (författare)
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Stiel, H. (författare)
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Vogt, Ulrich (författare)
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Radloff, W. (författare)
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Karpov, W. (författare)
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Sandner, W. (författare)
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Nickles, P. V. (författare)
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- 2001
- 2001
- Engelska.
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Ingår i: Physical Review E. Statistical, Nonlinear, and Soft Matter Physics. - 1063-651X .- 1095-3787. ; 6403:3
- Relaterad länk:
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
Ämnesord
Stäng
- Large Xe clusters (10(5)-10(6) atoms per cluster) have been irradiated with ultrashort (50 fs) and high-intensity (similar to2 x 10(18) W/cm(2)) pulses from a Ti:sapphire multi-TW laser at 800 nm wavelength. Scaling and absolute yield measurements of extreme ultraviolet (EUV) emission in a wavelength range between 7 and 15 nm in combination with cluster target characterization have been used for yield optimization. Maximum emission as a function of the backing pressure and a spatial emission anisotropy covering a factor of two at optimized yields is discussed with a simple model of the source geometry and EUV-radiation absorption. Circularly polarized laser light instead of linear polarization results in a factor of 2.5 higher emission in the 11 to 15 nm wavelength range. This indicates the initial influence of optical-field ionization for the interaction parameter range used and contrasts to collisional heating that seems to influence preferentially higher ionization. Absolute emission efficiency at 13.4 nm of up to 0.5% in 2 pi sr and 2.2% bandwidth has been obtained.
Nyckelord
- atomic clusters
- ray-emission
- wavelength dependence
- synchrotron-radiation
- gas clusters
- pulses
- lithography
- ionization
- spectroscopy
- scattering
Publikations- och innehållstyp
- ref (ämneskategori)
- art (ämneskategori)
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