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Influence of Si dop...
Abstract
Ämnesord
Stäng
- The band gap shift (BGS) of Si-doped wurtzite GaN for impurity concentrations spanning the insulating to the metallic regimes has been investigated at low temperature. The critical impurity concentration for the metal-non-metal transition is estimated from the generalized Drude approach for the resistivity to be about 1.0 x 10(18) cm(-3). The calculations for the BGS were carried out within a framework of the random phase approximation, taking into account the electron-electron, electron-optical phonon, and electron-ion interactions. In the wake of very recent photoluminescence measurements, we have shown and discussed the possible transitions involved in the experimental results.
Nyckelord
- iii-v nitrides
- doped gan
- band
- semiconductors
- si-p,bi
- shift
- donor
Publikations- och innehållstyp
- ref (ämneskategori)
- art (ämneskategori)
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