Towards a Single Event Upset Detector Based on COTS FPGA

• The Single Event Upset Detector (SEUD) is 3U CubeSat payload experiment that aims to achieve radiation tolerant computing through detection and correction of SEU bit flips on COTS SRAM FPGAs. Our proposed self-healing architecture applies selective TMR, internal configuration memory scrubbing, and partial reconfiguration and intends to demonstrate a cost-effective alternative to Space-grade radiation hardened SRAM FPGAs. This paper presents an overview of the ongoing development of the SEUD architecture and when complete, the SEUD will be tested on board the KTH MIST student CubeSat that is targeting to be launched in late 2020.

Ämnesord

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

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