Characterizing 3D Charge Trap NAND Flash : Observations, Analyses and Applications

• In the 3D era, the Charge Trap (CT) NAND flash is employed by mainstream products, thus having a deep understanding of its characteristics is becoming increasingly crucial for designing flash-based systems. In this paper, to enable such understanding, we implement comprehensive experiments on advanced 3D CT NAND flash chips by developing an ARM and FPGA-based evaluation platform. Based on the experimental results, we first make distinct observations on the characteristics of 3D CT NAND flash, including its performance and reliability features. Then we give analyses of the observations from physical and circuit aspects. Finally, based on the unique characteristics of 3D CT NAND flash, suggestions to optimize the flash management algorithms in real applications are presented.

Ämnesord

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

Nyckelord

3D CT NAND flash

performance

reliability

Publikations- och innehållstyp

ref (ämneskategori)

kon (ämneskategori)