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Feedback-Free Elect...
Feedback-Free Electromigrated Tunneling Junctions from Crack-Defined Gold Nanowires
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- Pagliano, Simone (författare)
- KTH,Mikro- och nanosystemteknik
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- Gota, Fabrizio (författare)
- KTH,Mikro- och nanosystemteknik
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Raja, Shyamprasad Natarajan (författare)
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- Dubois, Valentin J. (författare)
- KTH,Mikro- och nanosystemteknik
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- Stemme, Göran, 1958- (författare)
- KTH,Mikro- och nanosystemteknik
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- Niklaus, Frank, 1971- (författare)
- KTH,Mikro- och nanosystemteknik
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(creator_code:org_t)
- IEEE conference proceedings, 2019
- 2019
- Engelska.
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Ingår i: Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS). - : IEEE conference proceedings. ; , s. 365-367
- Relaterad länk:
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https://ieeexplore.i...
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https://kth.diva-por... (primary) (Raw object)
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
Ämnesord
Stäng
- Tunneling junctions are pairs of electrodes separated by gaps of a few nanometers that allow electrons to tunnel across the gap. Tunneling junctions are of great importance for applications such as label-free biomolecule sensing and single molecule electronics, but their fabrication remains difficult and laborious. In this paper, we present a simple 2-stage process for the fabrication of tunneling junctions consisting of electrode pairs made of gold (Au). This is achieved by combining a novel methodology for fabricating crack-defined Au nanowires at wafer-scale with a constant voltage, feedback-free electromigration procedure to form tunneling nanogaps free of debris.
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Nanoteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Nano-technology (hsv//eng)
Publikations- och innehållstyp
- ref (ämneskategori)
- kon (ämneskategori)