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Flicker noise conve...
Flicker noise conversion in CMOS LC oscillators : capacitance modulation dominance and core device sizing
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- Chen, Jian (författare)
- KTH,Elektroniksystem,VinnExcellence Center for Intelligence in Paper and Packaging, iPACK
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- Jonsson, Fredrik (författare)
- KTH,Elektroniksystem,VinnExcellence Center for Intelligence in Paper and Packaging, iPACK
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Carlsson, Mats (författare)
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Hedenäs, Charlotta (författare)
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- Zheng, Li-Rong (författare)
- KTH,Elektroniksystem,VinnExcellence Center for Intelligence in Paper and Packaging, iPACK
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(creator_code:org_t)
- 2011-05-20
- 2011
- Engelska.
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Ingår i: Analog Integrated Circuits and Signal Processing. - : Springer Science and Business Media LLC. - 0925-1030 .- 1573-1979. ; 68:2, s. 145-154
- Relaterad länk:
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
Ämnesord
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- Flicker noise upconversion mechanisms in oscillators have been acquired in the literature, however their relative weights are still under investigation. It is desirable to find the dominant one, since a certain noise suppression method reduces one mechanism but may increase another. In this work, we propose a systematic simulation method to distinguish their relative impacts. The outcome indicates parasitic capacitance is the dominant factor for both tail 1/f noise and switch pair 1/f noise upconversions, implying to use small dimension core devices. Design guidelines on sizing devices are presented and two suppression techniques are compared. Two voltage-controlled oscillators (VCOs) with these suppression techniques are fabricated in a 0.18 mu m CMOS process, allowing us to compare their performance. The two VCOs can be Focused-Ion-Beam (FIB) trimmed to change the width of switch pair FETs. The fair comparison of measurement results among them verify the dominant role of parasitic capacitance in 1/f noise upconversion. The measurement results also confirm the design guidelines and demonstrate the difference of two suppression methods.
Nyckelord
- Oscillator
- VCO
- Device sizing
- Flicker noise
- 1/f noise
- Phase noise
- TECHNOLOGY
- TEKNIKVETENSKAP
Publikations- och innehållstyp
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- art (ämneskategori)
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