Influence of Ti layer thickness on solid state amorphization and magnetic properties of annealed Ti/Ni multilayer

• Annealing induced SSR (solid state reaction) leading to amorphization and magnetic properties as a function of Ti layer thickness has been investigated using XRD (x-ray diffraction), GIXRR (grazing incidence x-ray reflectivity) and MOKE (magneto-optical Kerr effect) measurements. [Ti(t Å)/Ni(50 Å)] × 10 ML samples where t = 30, 50 and 70 Å have been prepared by using electron beam evaporation technique under ultra-high vacuum conditions at room temperature. The amorphization process was carefully studied using XRD and GIXRR techniques showing that the SSA (solid state amorphization) temperature gradually decreases with increasing Ti layer thickness. Corresponding MOKE measurements show a magnetic to non-magnetic transition near the amorphization temperature (TA) with annealing, for each of the Ti layer thicknesses, due to crystalline Ti–Ni alloy phase formation at interfaces. The saturation magnetization and coercivity were also modified with Ti layer thickness variation. In addition to this, anisotropy developed with Ti layer thickness and diminished with increasing annealing temperatures. All these magnetic changes due to Ti layer thickness variations are interpreted in terms of amorphization and micro-structural changes near the SSA temperature.

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