Microstructural characterization of the tool-chip interface enabled by focused ion beam and analytical electron microscopy

• A method based on focused ion beam milling and analytical electron microscopy to investigate the nature of the tool-chip interface is presented. It is employed to study tool-chip interfaces of the rake face of a (Ti0.83Si0.17)N coated PCBN insert after turning of case-hardened steel. Analytical electron microscopy shows the presence of a smeared adhered layer on the coating, which consists of steel elements from the work-piece, oxygen, and Si and N, most likely originating from the coating.

Nyckelord

Cutting tool

TiSiN

TEM

FIB

Microstructure

Hard coating

PCBN

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