SOC Test Optimization with Compression-Technique Selection

• The increasing test-data volumes needed for the testing of system-on-chip (SOC) lead to long test times and high memory requirements. We present an analysis to highlight the fact that the impact of a test-data compression technique on test time and compression ratio are method-dependant as well as TAM-width dependant. Therefore, we propose a technique where compression-technique selection is integrated with core wrapper design, test architecture design, and test scheduling to minimize the SOC test time and the test-data volume.

Ämnesord

NATURVETENSKAP  -- Data- och informationsvetenskap -- Datavetenskap (hsv//swe)

NATURAL SCIENCES  -- Computer and Information Sciences -- Computer Sciences (hsv//eng)

Nyckelord

systems-on-chip

testing

compression

Computer science

Datavetenskap

Publikations- och innehållstyp

vet (ämneskategori)

kon (ämneskategori)