Infrared ellipsometry and near-infrared-to-vacuum-ultraviolet ellipsometry study of free-charge carrier properties in In-polar p-type InN

Schöche, Stefan (författare)

Department of Electrical Engineering and Center for Nanohybrid Functional Materials, University of Nebraska-Lincoln, U.S.A.

Hofmann, Tino (författare)

Department of Electrical Engineering and Center for Nanohybrid Functional Materials, University of Nebraska-Lincoln, U.S.A.

Sedrine, Nebiha Ben (författare)

Instituto Tecnológico e Nuclear, Sacavém, Portugal

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Darakchieva, Vanja (författare)

Linköpings universitet,Halvledarmaterial,Tekniska högskolan

Wang, Xinqiang (författare)

State Key Lab of Artificial Microstructure and Mesoscopic Physics, Peking University, Beijing, China

Yoshikawa, Akihiko (författare)

Graduate School of Electrical and Electronics Engineering, Venture Business Laboratory, Chiba University, Chiba, Japan

Schubert, Mathias (författare)

Instituto Tecnológico e Nuclear, Sacavém, Portugal

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Department of Electrical Engineering and Center for Nanohybrid Functional Materials, University of Nebraska-Lincoln, US.A. Instituto Tecnológico e Nuclear, Sacavém, Portugal (creator_code:org_t)

2012-01-16

2012

Engelska.

Ingår i: MRS Proceedings Volume 1396. - : Springer Science and Business Media LLC. ; , s. o07-27

Relaterad länk:

https://urn.kb.se/re...

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https://doi.org/10.1...

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• Konferensbidrag (refereegranskat)