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Probing Defects in ...
Probing Defects in a Small Pixellated CdTe Sensor Using an Inclined Mono Energetic X-Ray Micro Beam
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- Fröjdh, Erik, 1984- (author)
- Mittuniversitetet,Institutionen för informationsteknologi och medier (-2013),Radiation detection
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- Fröjdh, Christer (author)
- Mittuniversitetet,Institutionen för informationsteknologi och medier (-2013),Radiation Detectors
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- Gimenez, Eva (author)
- Diamond Light Source
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- Krapohl, David (author)
- Mittuniversitetet,Institutionen för informationsteknologi och medier (-2013),Radiation Detectors
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- Maneuski, Dizmitry (author)
- Glasgow University
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- O'Shea, Val (author)
- Glasgow University
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- Norlin, Börje (author)
- Mittuniversitetet,Institutionen för informationsteknologi och medier (-2013),Radiation Detectors
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- Wilhelm, Heribert (author)
- Diamond Light Source
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- Tartoni, Nicola (author)
- Diamond Light Source
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- Thungström, Göran (author)
- Mittuniversitetet,Institutionen för informationsteknologi och medier (-2013)
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- Zain, Rasif (author)
- Glasgow University
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(creator_code:org_t)
- IEEE conference proceedings, 2012
- 2012
- English.
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In: 2012 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE RECORD (NSS/MIC). - : IEEE conference proceedings. - 9781467320306 - 9781467320283 ; , s. 4233-4236
- Related links:
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https://urn.kb.se/re...
Abstract
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- High quantum efficiency is important in X-ray imaging applications. This means using high-Z sensor materials. Unfortunately many of these materials suffer from defects that cause non-ideal charge transport. In order to increase the understanding of these defects, we have mapped the 3D response of a number of defects in two 1 mm thick CdTe sensors with different pixel sizes (55 mu m and 110 mu m) using a monoenergetic microbeam at 79 keV. The sensors were bump bonded to Timepix read out chips. Data was collected in photon counting as well as time-over-threshold mode. The time-over-threshold mode is a very powerful tool to investigate charge transport properties and fluorescence in pixellated detectors since the signal from the charge that each photon deposits in each pixel can be analyzed. Results show distorted electrical field around the defects and indications of excess leakage current and large differences in behavior between electron collection and hole collection mode. The experiments were carried out in the Extreme Conditions Beamline I15 at Diamond Light Source.
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- kon (subject category)
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- By the author/editor
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Fröjdh, Erik, 19 ...
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Fröjdh, Christer
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Gimenez, Eva
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Krapohl, David
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Maneuski, Dizmit ...
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O'Shea, Val
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show more...
-
Norlin, Börje
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Wilhelm, Heriber ...
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Tartoni, Nicola
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Thungström, Göra ...
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Zain, Rasif
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show less...
- Articles in the publication
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2012 IEEE NUCLEA ...
- By the university
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Mid Sweden University