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Comparative Study o...
Comparative Study of UV Radiation Hardness of n+p and p+n Duo-Lateral Position Sensitive Detectors
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- Esebamen, Omeime Xerviar (författare)
- Mittuniversitetet,Avdelningen för elektronikkonstruktion
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- Thungström, Göran (författare)
- Mittuniversitetet,Avdelningen för elektronikkonstruktion
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- Nilsson, Hans-Erik (författare)
- Mittuniversitetet,Avdelningen för elektronikkonstruktion
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- Lundgren, Anders (författare)
- SiTek Electro Opt, SE-43330 Partille, Sweden
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(creator_code:org_t)
- 2014-10-15
- 2014
- Engelska.
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Ingår i: European Physical Journal. - : EDP Sciences. - 1286-0042 .- 1286-0050. ; 68:2, s. Art. no. 21301-
- Relaterad länk:
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https://miun.diva-po... (primary) (Raw object)
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http://miun.diva-por...
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
Ämnesord
Stäng
- We report experimental results on the degree of radiation damage in two duo-lateral position sensitive detectors (LPSDs) exposed to 193 nm and253 nm ultraviolet (UV) beam. One of the detectors was an in-house fabricated n(+) p LPSD and the other was a commercially available p(+) n LPSD. We report that at both wavelengths, the degradation damage from the UV photons absorption caused a much more significant deterioration in responsivity in the p(+) n LPSD than in the n(+) p LPSD. By employing a simple method, we were able to visualize the radiation damage on the active area of the LPSDs using 3-dimensional graphs. We were also able to characterize the impact of radiation damage on the linearity and position error of the detectors.
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Publikations- och innehållstyp
- ref (ämneskategori)
- art (ämneskategori)
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