Sökning: id:"swepub:oai:DiVA.org:miun-368" >
Characterisation of...
Characterisation of the charge sharing in pixellated Si detectors with single-photon processing readout
-
- Norlin, Börje (författare)
- Mittuniversitetet,Institutionen för informationsteknologi och medier (-2013),STC
-
- Fröjdh, Christer (författare)
- Mittuniversitetet,Institutionen för informationsteknologi och medier (-2013),STC
-
- Nilsson, Hans-Erik (författare)
- Mittuniversitetet,Institutionen för informationsteknologi och medier (-2013)
-
visa fler...
-
- Graafsma, Heinz (författare)
- Experimental Division, ESRF, Avenue des Martyrs, 38043 Grenoble Cedex, France
-
- Vonk, Vederan (författare)
- Experimental Division, ESRF, Avenue des Martyrs, 38043 Grenoble Cedex, France
-
- Ponchut, Cyril (författare)
- Experimental Division, ESRF, Avenue des Martyrs, 38043 Grenoble Cedex, France
-
visa färre...
-
(creator_code:org_t)
- Elsevier BV, 2006
- 2006
- Engelska.
-
Ingår i: Nuclear Instruments and Methods in Physics Research Section A. - : Elsevier BV. - 0168-9002 .- 1872-9576. ; A 563:1, s. 133-136
- Relaterad länk:
-
https://urn.kb.se/re...
-
visa fler...
-
https://doi.org/10.1...
-
visa färre...
Abstract
Ämnesord
Stäng
- Pixellated silicon detectors with a thickness of 300 µm and 700 µm bonded to the MEDIPIX2 readout chip have been characterised using a monoenergetic microbeam at the ESRF. The spectral response when a 10 x 10 µm2 wide 40 keV beam is centred on a single pixel is achieved. When the beam is scanned over the pixel, the charge sharing will increase when the beam approaches the border of the pixel. The experimental results have been verified by charge transport simulations and X-ray scattering simulations. Agreement between measurements and simulations can be achieved if a wider beam is assumed in the simulations. Widening of the absorption profile can to a large extent be explained by backscattering of lower energy photons by the tin/led bump-bounds below the detector. Widening of the detected beam is also an effect of angular alignment problems, especially on the 700 µm detector. Since the angel between the depth and a half pixel is only 2.2º, alignment of thick pixellated silicon detectors will be a problem to consider when designing X-ray imaging setups.
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Nyckelord
- Charge sharing
- X-ray
- Medipix
- Pixel detector
- Monte Carlo simulation
- Synchrotron radiation
- Electrical engineering, electronics and photonics
- Elektroteknik, elektronik och fotonik
Publikations- och innehållstyp
- ref (ämneskategori)
- art (ämneskategori)
Hitta via bibliotek
Till lärosätets databas