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Incorporation effec...
Incorporation effects of Si in TiCx thin films
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- Tengstrand, Olof (författare)
- Linköpings universitet,Tunnfilmsfysik,Tekniska högskolan
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- Nedfors, Nils (författare)
- Uppsala universitet,Oorganisk kemi,Uppsala University, Sweden
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- Alling, Björn (författare)
- Linköpings universitet,Tunnfilmsfysik,Tekniska högskolan
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- Jansson, Ulf (författare)
- Uppsala universitet,Oorganisk kemi,Uppsala University, Sweden
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- Flink, Axel (författare)
- Linköpings universitet,Tunnfilmsfysik,Tekniska högskolan,Impact Coatings AB, SE-58216 Linkoping, Sweden
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- Eklund, Per (författare)
- Linköpings universitet,Tunnfilmsfysik,Tekniska högskolan
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- Hultman, Lars (författare)
- Linköpings universitet,Tunnfilmsfysik,Tekniska högskolan
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(creator_code:org_t)
- Elsevier BV, 2014
- 2014
- Engelska.
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Ingår i: Surface & Coatings Technology. - : Elsevier BV. - 0257-8972 .- 1879-3347. ; 258, s. 392-397
- Relaterad länk:
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https://urn.kb.se/re...
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https://doi.org/10.1...
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https://urn.kb.se/re...
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Abstract
Ämnesord
Stäng
- Ti-Si-C thin films with varying Si content between 0 to 10 at.% were deposited by DC magnetron sputtering from elemental targets. The effects on microstructure and lattice parameters were investigated using x-ray diffraction, x-ray photoelectron spectroscopy, transmission electron microscopy, and first-principles calculations. The results show that the growth of pure TiCx onto Al2O3(0001) substrates at a temperature of 350 degrees C yields (111) epitaxial and understoichiometric films with x similar to 0.7. For Si contents up to 4 at.%, the TiCx epitaxy is retained locally. Si starts to segregate out from the TiCx to column boundaries at concentrations between 1 and 4 at.%, and causes a transition from epitaxial to polycrystalline growth above 4 at.%. Eventually, the top part of the films form a nanocomposite of crystalline TiC grains surrounded by amorphous SiC and C for Si contents studied up to 10 at.%. The results show that Si takes the place of carbon when incorporated in the TiC lattice.
Ämnesord
- NATURVETENSKAP -- Fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences (hsv//eng)
Nyckelord
- First-principles calculations
- Thin films
- Ti-C
- Silicon
- Physical vapor deposition (PVD)
Publikations- och innehållstyp
- ref (ämneskategori)
- art (ämneskategori)
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