Extraction of thermal time constant in HBTs using small signal measurements

• A novel method for finding the thermal time constant of HBTs is proposed. It utilises small signal measurements in the frequency domain of the typical negative differential resistance found int he active region, i.e. normal bias conditions for the device.

Ämnesord

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik -- Signalbehandling (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering -- Signal Processing (hsv//eng)

Nyckelord

heterojunction bipolar transistors; semiconductor device characterisation

Signal processing

Signalbehandling

Publikations- och innehållstyp

ref (ämneskategori)

art (ämneskategori)