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Surface defect pass...
Surface defect passivation by a thin metallic barrier for Cu(InxGa1-x)Se2 co-evaporation on Cr-steel substrates
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- Donzel-Gargand, Olivier, 1986- (författare)
- Uppsala universitet,Fasta tillståndets elektronik,Thin Film Solar Cells
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- Thersleff, Thomas (författare)
- Uppsala universitet,Tillämpad materialvetenskap
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- Fourdrinier, Lionel (författare)
- Uppsala universitet,Tillämpad materialvetenskap
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- Leifer, Klaus (författare)
- Uppsala universitet,Tillämpad materialvetenskap
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- Edoff, Marika (författare)
- Uppsala universitet,Fasta tillståndets elektronik
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(creator_code:org_t)
- Elsevier, 2016
- 2016
- Engelska.
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Ingår i: Thin Solid Films. - : Elsevier. - 0040-6090 .- 1879-2731. ; 619, s. 220-226
- Relaterad länk:
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http://dx.doi.org/10...
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
Ämnesord
Stäng
- The use of Cr-steel substrates for the fabrication of Cu(In,Ga)Se2 (CIGS) solar cells is highly desirable and is a topic of considerable research interest. However, solar cells on non-treated steel substrates often exhibit decreased performance compared to their homologues on soda lime glass substrates. This is partly attributed to out-diffusion of steel components (Fe, Cr, Mn, etc.) into the solar cell. To avoid this contamination, thin film barriers can be added on top of the steel surface, but they do not always prevent the diffusion completely. In this paper we study the potential of using Cr and Ti as thin barrier layers. We find that local surface defects on the steel, several micrometers in height, lead to cracks in the back contact as well as in the barrier layers. Advanced transmission electron microscopy (TEM) techniques reveal that elemental diffusion and chemical reactions occur at these openings during heat treatments in Se atmosphere. TEM-energy dispersive X-ray spectroscopy (TEM-EDX) analysis in combination with calculation of the solid state diffusion coefficient demonstrate that a Cr-barrier sacrificially protects the Cr-steel substrate, blocking most of the Fe out-diffusion, whereas a Ti-barrier is less efficient.
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Materialteknik -- Metallurgi och metalliska material (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Materials Engineering -- Metallurgy and Metallic Materials (hsv//eng)
- NATURVETENSKAP -- Fysik -- Den kondenserade materiens fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences -- Condensed Matter Physics (hsv//eng)
- TEKNIK OCH TEKNOLOGIER -- Naturresursteknik -- Energisystem (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Environmental Engineering -- Energy Systems (hsv//eng)
Nyckelord
- Back contact; Thin film; Solar cell; Steel substrate; CuInGaSe2; Electron microscopy; Diffusion; Barrier
- Teknisk fysik med inriktning mot materialanalys
- Engineering Science with specialization in Materials Analysis
- Teknisk fysik med inriktning mot materialvetenskap
- Engineering Science with specialization in Materials Science
Publikations- och innehållstyp
- ref (ämneskategori)
- art (ämneskategori)
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