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Secondary ion mass ...
Secondary ion mass spectrometry as a tool to study selenium gradient in Cu2ZnSn(S,Se)4
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- Grini, Sigbjörn (author)
- Univ Oslo, Dept Phys, Ctr Mat Sci & Nanotechnol, POB 1048, N-0316 Oslo, Norway.
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- Ross, Nils (author)
- Univ Oslo, Dept Phys, Ctr Mat Sci & Nanotechnol, POB 1048, N-0316 Oslo, Norway.
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- Sky, Thomas Neset (author)
- Univ Oslo, Dept Phys, Ctr Mat Sci & Nanotechnol, POB 1048, N-0316 Oslo, Norway.
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- Persson, Clas (author)
- Univ Oslo, Dept Phys, Ctr Mat Sci & Nanotechnol, POB 1048, N-0316 Oslo, Norway.
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- Platzer Björkman, Charlotte, 1976- (author)
- Uppsala universitet,Fasta tillståndets elektronik,Uppsala Univ, Solid State Elect, Angstrom Solar Ctr, Box 534, S-75121 Uppsala, Sweden.
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- Vines, Lasse (author)
- Univ Oslo, Dept Phys, Ctr Mat Sci & Nanotechnol, POB 1048, N-0316 Oslo, Norway.
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Univ Oslo, Dept Phys, Ctr Mat Sci & Nanotechnol, POB 1048, N-0316 Oslo, Norway Fasta tillståndets elektronik (creator_code:org_t)
- 2017-02-21
- 2017
- English.
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In: Physica Status Solidi. C, Current topics in solid state physics. - : Wiley. - 1610-1634 .- 1610-1642. ; :6
- Related links:
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
Subject headings
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- Secondary ion mass spectrometry (SIMS) has been utilized to study compositional gradients in compound-sputtered and annealed Cu2ZnSn(S,Se)(4) (CZTSSe). SIMS image depth profiling shows a non-uniform spatial distribution of selenium and supports a mechanism where selenization is accompanied by grain growth rather than substitution of selenium for sulfur. Furthermore, SIMS depth profiles of S and Se using O-2(+) primary ions and detecting molecular ions of the MCs+ type using Cs+ primary ions have been compared, where a linear relationship between the sulfur and selenium concentration suitable for compositional analysis is observed for concentrations with an Se/(S+Se) ratio in the range from 0.25 to 0.65. 3D image of the spatial Se distribution in a 20 x 20 mu m(2) grid measured with SIMS image depth profiling.
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
- TEKNIK OCH TEKNOLOGIER -- Materialteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Materials Engineering (hsv//eng)
Keyword
- Cu2ZnSn(S
- Se)(4)
- kesterite
- secondary ion mass spectrometry
- Se gradient
Publication and Content Type
- ref (subject category)
- art (subject category)
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