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Time Domain Charact...
Time Domain Characterization of High Power Solid State Amplifiers for the Next Generation Linear Accelerators
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- Hoang Duc, Long (författare)
- Uppsala universitet,FREIA,Fasta tillståndets elektronik
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- Bhattacharyya, Anirban (författare)
- Uppsala universitet,FREIA
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- Goryashko, Vitaliy, 1982- (författare)
- Uppsala universitet,FREIA
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- Ruber, Roger (författare)
- Uppsala universitet,FREIA,Högenergifysik
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- Olsson, Jörgen, 1966- (författare)
- Uppsala universitet,Fasta tillståndets elektronik
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- Dancila, Dragos (författare)
- Uppsala universitet,FREIA,Fasta tillståndets elektronik
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(creator_code:org_t)
- 2017-12-01
- 2018
- Engelska.
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Ingår i: Microwave and optical technology letters (Print). - : Wiley. - 0895-2477 .- 1098-2760. ; 60:1, s. 163-171
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https://uu.diva-port... (primary) (Raw object)
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http://uu.diva-porta...
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
Ämnesord
Stäng
- This paper presents the time domain characterization of high power pulsed solid state amplifiers to be used forlinear accelerator applications. The study comprises nonlinear circuit envelope simulations and time domainenvelope measurements. Measurements and simulations are performed under the pulsed conditions (3.5 mspulse width, 5% duty cycle) specific to the European Spallation Source (ESS) high intensity proton accelerator.We measure the characteristics of pulsed LDMOS based power amplifiers such as: pulse droop along the pulse,efficiency, average envelope pulse amplitude and phase, pulse drain current waveform, pulse drain voltagewaveform, etc. A comparison between the measured results and the simulated results is also presented. Inaddition to the pulse profile characterization, the pulse to pulse (P2P) stability of the presented solid state poweramplifier (SSPA) is investigated as variations of amplitude and phase. The P2P stability simulations areintroduced as a combination of the Monte-Carlo simulations and the nonlinear circuit envelope simulations. Thesimulated results are used for fitting the P2P measurements to give an early insight of causes of instabilities ofthe nonlinear LDMOS models.
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Nyckelord
- accelerator
- solid state amplifiers
- LDMOS
- nonlinear circuit envelope
- time domain envelope measurements
- pulse profile
Publikations- och innehållstyp
- ref (ämneskategori)
- art (ämneskategori)
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