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A 0.28-0.8 V 320 fW...
A 0.28-0.8 V 320 fW D-latch for Sub-VT Memories in 65 nm CMOS
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- Mohammadi, Babak (författare)
- Lund University,Lunds universitet,Institutionen för elektro- och informationsteknik,Institutioner vid LTH,Lunds Tekniska Högskola,Department of Electrical and Information Technology,Departments at LTH,Faculty of Engineering, LTH
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- Andersson, Oskar (författare)
- Lund University,Lunds universitet,Institutionen för elektro- och informationsteknik,Institutioner vid LTH,Lunds Tekniska Högskola,Department of Electrical and Information Technology,Departments at LTH,Faculty of Engineering, LTH
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Meinerzhagen, Pascal (författare)
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- Sherazi, Syed Muhammad Yasser (författare)
- Lund University,Lunds universitet,Institutionen för elektro- och informationsteknik,Institutioner vid LTH,Lunds Tekniska Högskola,Department of Electrical and Information Technology,Departments at LTH,Faculty of Engineering, LTH
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Burg, Andreas (författare)
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- Rodrigues, Joachim (författare)
- Lund University,Lunds universitet,Institutionen för elektro- och informationsteknik,Institutioner vid LTH,Lunds Tekniska Högskola,Department of Electrical and Information Technology,Departments at LTH,Faculty of Engineering, LTH
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(creator_code:org_t)
- 2014
- 2014
- Engelska.
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Ingår i: [Host publication title missing].
- Relaterad länk:
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http://dx.doi.org/10...
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https://lup.lub.lu.s...
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https://doi.org/10.1...
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Abstract
Ämnesord
Stäng
- The design of an ultra-low-leakage latch, suitable for subthreshold standard-cell based memories in 65nm CMOS is presented. Various latch architectures are compared in terms of leakage, area and speed. The most leakage-efficient architecture is optimized by transistor stacking and channel length stretching. The final design is supplemented with a 3-state output buffer to provide low-leakage read functionality in memory applications. Silicon measurements confirm simulation results including the reliability analysis based on Monte-Carlo simulations. The latch is fully functional at 280 mV and retains data down to a supply voltage of 220mV, consuming as little as 230fW leakage power
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Publikations- och innehållstyp
- kon (ämneskategori)
- ref (ämneskategori)