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Nondestructive Test...
Nondestructive Testing Using mm-Wave Sparse Imaging Verified for Singly Curved Composite Panels
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- Wingren, Niklas (författare)
- Lund University,Lunds universitet,Teoretisk elektroteknik,Forskargrupper vid Lunds universitet,LTH profilområde: AI och digitalisering,LTH profilområden,Lunds Tekniska Högskola,Electromagnetic Theory,Lund University Research Groups,LTH Profile Area: AI and Digitalization,LTH Profile areas,Faculty of Engineering, LTH
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- Sjöberg, Daniel (författare)
- Lund University,Lunds universitet,Institutionen för elektro- och informationsteknik,Institutioner vid LTH,Lunds Tekniska Högskola,Teoretisk elektroteknik,Forskargrupper vid Lunds universitet,LTH profilområde: AI och digitalisering,LTH profilområden,Department of Electrical and Information Technology,Departments at LTH,Faculty of Engineering, LTH,Electromagnetic Theory,Lund University Research Groups,LTH Profile Area: AI and Digitalization,LTH Profile areas,Faculty of Engineering, LTH
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(creator_code:org_t)
- 2022
- 2022
- Engelska 5 s.
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Ingår i: IEEE Transactions on Antennas and Propagation. - 0018-926X. ; 71:1, s. 1185-1189
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Abstract
Ämnesord
Stäng
- Nondestructive testing of composite materials is important in aerospace applications, and mm-wave imaging has been increasingly used for this purpose. Imaging is traditionally performed using Fourier methods, with inverse methods being an alternative. This communication presents a mm-wave imaging method with an inverse approach intended for nondestructive testing of singly curved composite panels with sparsely distributed flaws. It builds on previous work which was limited to imaging on planar panels. The move from planar to singly curved panels increases the applicability of the method for aerospace applications. The imaging method is reference-free due to a numerical source separation algorithm and exploits sparsity in reconstruction of scatterers. It is demonstrated using near-field measurements at 60 GHz of an industrially manufactured composite panel with deliberate flaws. Compared to a more traditional Fourier imaging method, our method generates images with higher resolution and higher dynamic range. Flaw detection is also easier using our method as it generates images with less background clutter.
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Nyckelord
- image reconstruction
- inverse problems
- microwave imaging
- nondestructive testing
- source separation
Publikations- och innehållstyp
- art (ämneskategori)
- ref (ämneskategori)
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