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Effect of Si cap la...
Effect of Si cap layer on parasitic channel operation in Si/SiGe metal-oxide-semiconductor structures
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- Sareen, Alok, 1972 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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Wang, Y. (author)
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- Södervall, Ulf, 1954 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Lundgren, Per, 1968 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Bengtsson, Stefan, 1961 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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show less...
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(creator_code:org_t)
- 2003
- 2003
- English.
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In: Journal Of Applied Physics. ; 93:6, s. 3545-3552
- Related links:
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Subject headings
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Subject headings
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Publication and Content Type
- art (subject category)
- ref (subject category)
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