Multiparameter admittance spectroscopy (Invited)

• Multiparameter admittance spectroscopy is described for investigating interface state properties of metal-oxide-semiconductor structures. In the conductance mode of this method, it allows for obtaining three-dimensional or contour plots of conductance data which reveal the mechanisms for capture of charge carriers into the interface states.

Ämnesord

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

Publikations- och innehållstyp

kon (ämneskategori)

ref (ämneskategori)