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Study of A1/Nb inte...
Study of A1/Nb interface by spectroscopy of reflected electrons
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- Afanas´ev, V.P. (författare)
- National Research University Moscow Power Engineering Institute
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- Lubenchenko, A.V. (författare)
- National Research University Moscow Power Engineering Institute
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- Lukashevsky, M.V. (författare)
- National Research University Moscow Power Engineering Institute
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- Norell, Mats, 1961 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Pavolotskiy, Alexey, 1968 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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(creator_code:org_t)
- AIP Publishing, 2007
- 2007
- Engelska.
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Ingår i: Journal of Applied Physics. - : AIP Publishing. - 0021-8979 .- 1089-7550. ; 101:064912, s. 1-6
- Relaterad länk:
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http://dx.doi.org/10...
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https://doi.org/10.1...
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https://research.cha...
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Abstract
Ämnesord
Stäng
- We have studied Al/Nb interface with help of spectroscopy of reflected electrons. Ion sputtering combined with monitoring of Auger peaks has been used to approach the interface. The developed method of quantitative interpretation of spectra allowed us to characterize the distribution of Al and Nb in the interface region with a nanometer depth resolution. The Al/Nb interface was found to have an intermediate layer of about 10 nm thickness, which is more likely due to the interface roughness, rather than diffusion smearing. We discuss the possibility to distinguish by means of spectroscopy of reflected electrons either material under analysis is a single phase or a mixture of two phases.
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Publikations- och innehållstyp
- art (ämneskategori)
- ref (ämneskategori)
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