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In situ characteriz...
In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy
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- Lotze, Gudrun (författare)
- Lund University,Lunds universitet,MAX IV-laboratoriet,LINXS - Institute of advanced Neutron and X-ray Science,Kemiska institutionen,Institutioner vid LTH,Lunds Tekniska Högskola,MAX IV Laboratory,Department of Chemistry,Departments at LTH,Faculty of Engineering, LTH,Max IV-laboratoriet
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- Harihara Subramonia Iyer, Anand, 1990 (författare)
- Chalmers University of Technology,Chalmers tekniska högskola
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- Bäcke, Olof, 1984 (författare)
- Chalmers University of Technology,Chalmers tekniska högskola
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visa fler...
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- Kalbfleisch, Sebastian (författare)
- Lund University,Lunds universitet,MAX IV, NanoMAX,MAX IV, Imaging,MAX IV, Avdelningen för livsvetenskaper,MAX IV-laboratoriet,MAX IV, NanoMAX,MAX IV, Imaging,MAX IV, Life Science division,MAX IV Laboratory,Max IV-laboratoriet
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- Hörnqvist Colliander, Magnus, 1979 (författare)
- Chalmers University of Technology,Chalmers tekniska högskola
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(creator_code:org_t)
- 2024
- 2024
- Engelska.
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Ingår i: Journal of Synchrotron Radiation. - 1600-5775 .- 0909-0495. ; 31:Pt 1, s. 42-54
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Abstract
Ämnesord
Stäng
- The use of hard X-ray transmission nano- and microdiffraction to perform in situ stress and strain measurements during deformation has recently been demonstrated and used to investigate many thin film systems. Here a newly commissioned sample environment based on a commercially available nanoindenter is presented, which is available at the NanoMAX beamline at the MAX IV synchrotron. Using X-ray nanoprobes of around 60-70 nm at 14-16 keV and a scanning step size of 100 nm, we map the strains, stresses, plastic deformation and fracture during nanoindentation of industrial coatings with thicknesses in the range of several micrometres, relatively strong texture and large grains. The successful measurements of such challenging samples illustrate broad applicability. The sample environment is openly accessible for NanoMAX beamline users through the MAX IV sample environment pool, and its capability can be further extended for specific purposes through additional available modules.
Ämnesord
- NATURVETENSKAP -- Fysik -- Acceleratorfysik och instrumentering (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences -- Accelerator Physics and Instrumentation (hsv//eng)
- TEKNIK OCH TEKNOLOGIER -- Materialteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Materials Engineering (hsv//eng)
Nyckelord
- nanodiffraction
- sample environment
- in situ deformation
- stress mapping
- nanoindentation
- in situ deformation
- nanodiffraction
- nanoindentation
- sample environment
- stress mapping
Publikations- och innehållstyp
- art (ämneskategori)
- ref (ämneskategori)
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