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Thin foil analysis ...
Thin foil analysis in the SEM
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- Halvarsson, Mats, 1965 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Jonsson, Torbjörn, 1970 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Canovic, Sead, 1979 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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(creator_code:org_t)
- 2008-09-25
- 2008
- Engelska.
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Ingår i: Journal of Physics: Conference Series. - : IOP Publishing. - 1742-6588 .- 1742-6596. ; 126, s. 4-
- Relaterad länk:
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http://dx.doi.org/10...
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http://iopscience.io...
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https://research.cha...
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https://doi.org/10.1...
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Abstract
Ämnesord
Stäng
- This paper explores the possibilities for imaging and chemical analysis of thin foil specimens in the SEM. Bright field and dark field imaging provide high resolution imaging with crystallographic information within the grains. In multiphase materials with varying electron transmission the dark field images generally provide a more even contrast in all phases. It is possible to obtain high-quality quantitative EDX data with high spatial resolution.
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Annan teknik -- Övrig annan teknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Other Engineering and Technologies -- Other Engineering and Technologies not elsewhere specified (hsv//eng)
Publikations- och innehållstyp
- art (ämneskategori)
- ref (ämneskategori)
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