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Study on the verifi...
Study on the verification of IR and RTD methods applied in the thermal measurement of high power chips
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- Zhang, Yan (författare)
- Shanghai University
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- He, C. (författare)
- Shanghai University
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- Zhang, Yong, 1982 (författare)
- Shanghai University
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- Fu, Yifeng, 1984 (författare)
- SHT Smart High-Tech AB
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- Fan, J. (författare)
- Shanghai University
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- Liu, Johan, 1960 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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(creator_code:org_t)
- ISBN 9781479947072
- 2014
- 2014
- Engelska.
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Ingår i: 15th International Conference on Electronic Packaging Technology, ICEPT 2014; Wangjiang HotelChengdu; China; 12 August 2014 through 15 August 2014. - 9781479947072 ; , s. 1507-1511
- Relaterad länk:
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http://dx.doi.org/10...
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https://doi.org/10.1...
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https://research.cha...
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Abstract
Ämnesord
Stäng
- In the present paper, a chip with a Pt-based RTD that functions as a heater and sensor is tested under serial power loads, and infrared (IR) thermal imaging system is adopted to obtain the thermal measurement. Comparisons of the hotspot temperatures of the chip obtained by RTD and IR methods have been made, where different surfaces of the chip were observed by the IR camera. Combing with the heat conduction law, the IR results of the test chip with surface preparation showed quite a good agreement with the RTD data, verifying the validation of the IR analysis method.
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Nanoteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Nano-technology (hsv//eng)
Nyckelord
- IR
- thermal measurement
- RTD
Publikations- och innehållstyp
- kon (ämneskategori)
- ref (ämneskategori)
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