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Post-processing yie...
Post-processing yield maps of winter wheat using data from satellites and combines
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- Alshihabi, Omran (författare)
- Swedish University of Agricultural Sciences,Sveriges lantbruksuniversitet,Institutionen för mark och miljö,Department of Soil and Environment
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- Persson, Kristian (författare)
- Swedish University of Agricultural Sciences,Sveriges lantbruksuniversitet,Institutionen för mark och miljö,Department of Soil and Environment
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- Söderström, Mats (författare)
- Swedish University of Agricultural Sciences,Sveriges lantbruksuniversitet,Institutionen för mark och miljö,Department of Soil and Environment
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(creator_code:org_t)
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- ISBN 9789086863938
- 2023
- 2023
- Engelska.
- Relaterad länk:
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https://res.slu.se/i...
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visa fler...
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https://doi.org/10.3...
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visa färre...
Abstract
Ämnesord
Stäng
- Yield mapping is important for evaluation of crop management and for delineation of management zones. In this study, a simple approach was developed to map winter wheat (Triticum aestivum L.) yield in fields missing combine yield data, based on yield data from other fields in the neighbourhood combined with Sentinel-2 data (ESA, EU). The study focused on which vegetation index (VI), which growth stage and which spatial resolution was optimal for yield mapping. The results showed that the VI map resolution did not significantly affect the mapping model, a combination of bands in the short-wave infrared and near infrared region was the most efficient in yield mapping and that satellite data from later growth stages (in the milk development stage) were better in mapping the final yield if compared with earlier stages.
Ämnesord
- LANTBRUKSVETENSKAPER -- Lantbruksvetenskap, skogsbruk och fiske -- Jordbruksvetenskap (hsv//swe)
- AGRICULTURAL SCIENCES -- Agriculture, Forestry and Fisheries -- Agricultural Science (hsv//eng)
- TEKNIK OCH TEKNOLOGIER -- Naturresursteknik -- Fjärranalysteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Environmental Engineering -- Remote Sensing (hsv//eng)
Publikations- och innehållstyp
- ref (ämneskategori)
- kon (ämneskategori)
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