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- Ahlberg, Mats, et al.
(författare)
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Proton-Induced X-Ray Analysis of Steel Surfaces for Microprobe Purposes
- 1975
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Ingår i: Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment. - 0167-5087. ; 123:2, s. 385-393
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Tidskriftsartikel (refereegranskat)abstract
- A study of the detection limits for the elements with Z = 15-92 in thick target steel surfaces using proton-induced X-ray technique has been performed. Samples were irradiated with a broad proton beam of 2 mm diameter and the X-rays were detected by a Si(Li) detector. Detection limits at levels down to the order of 10 ppm were achieved with simultaneous measurement of several elements. Mylar and chromium absorbers were introduced in front of the semiconductor detector and irradiations at two different proton energies (1.0 and 2.5 MeV) were carried out in order to elucidate their effects on detection limits. The results are valid for microbeam analysis.
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- Ahlberg, Mats, et al.
(författare)
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Proton-Induced X-Ray Emission in the Trace Analysis of Human Tooth Enamel and Dentine
- 1976
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Ingår i: International Journal of Applied Radiation and Isotopes. ; 27:5-6, s. 279-290
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Tidskriftsartikel (refereegranskat)abstract
- In this study the feasibility of applying proton-induced X-ray emission spectroscopy (PIXE) to the trace element analysis of human tooth enamel and dentine is investigated. Detection limits on the order of 1–10 ppm are obtained. Depth yields for different elements and proton energies are discussed. Enhancement calculations show that the effect for PIXE analysis is less important than for X-ray induced X-ray analysis. However, for elements with an absorption edge just below an intense X-ray line from a major element the enhancement effect is significant, and, due to the 40% calcium in the enamel matrix, it is estimated to be 15% for potassium. The importance of a smooth sample surface is discussed.
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- Akselsson, Roland, et al.
(författare)
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Luftföroreningar vid svetsning
- 1977
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Rapport (övrigt vetenskapligt/konstnärligt)abstract
- PIXE-analyser kan utföras med utvecklad analysuppställning med noggrannhet och precision av c:a 10 % och med hög analyskapacitet. Ett dataprogram för evaluering av räntgenspektra presenteras. Inverkan av provtjocklek vid PIXE-analys av inhomogena prov har studerats och korrektioner föreslås. Fluorinnehållet i filterprov har bestämts, samtidigt med PIXE-analys, genom utnyttjande av en kärnfysikalisk reaktion som ger resultat med god noggrannhet och precision. Svetsaerosoler har karakteriserats m.h.a. PIXE, ESCA och TEM/EDAX. En uppställning för insamling av svetsaerosoler under utveckling och hittillsvarande resultat indikerar representativ provinsamling med god reproducerbarhet.
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