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Sökning: swepub > Hultman Lars

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1.
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2.
  • Luo, Jun, et al. (författare)
  • Surface-energy triggered phase formation and epitaxy in nanometer-thick Ni1-xPtx silicide films
  • 2010
  • Ingår i: Applied Physics Letters. - : AIP Publishing. - 0003-6951 .- 1077-3118. ; 96:3
  • Tidskriftsartikel (refereegranskat)abstract
    • The formation of ultrathin silicide films of Ni1-xPtx at 450-850 degrees C is reported. Without Pt (x=0) and for t(Ni)< 4 nm, epitaxially aligned NiSi2-y films readily grow and exhibit extraordinary morphological stability up to 800 degrees C. For t(Ni)>= 4 nm, polycrystalline NiSi films form and agglomerate at lower temperatures for thinner films. Without Ni (x=1) and for t(Pt)=1-20 nm, the annealing behavior of the resulting PtSi films follows that for the NiSi films. The results for Ni1-xPtx of other compositions support the above observations. Surface energy is discussed as the cause responsible for the distinct behavior in phase formation and morphological stability.
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3.
  • Alling, Björn, 1980-, et al. (författare)
  • Mixing and decomposition thermodynamics of c-Ti1-xAlxN from first-principles calculations
  • 2007
  • Ingår i: Physical Review B. Condensed Matter and Materials Physics. - 1098-0121 .- 1550-235X. ; 75:045123
  • Tidskriftsartikel (refereegranskat)abstract
    • Wedescribe an efficient first-principles method that can be used tocalculate mixing enthalpies of transition metal nitrides with B1 structureand substitutional disorder at the metal sublattice. The technique isbased on the density functional theory. The independent sublattice modelis suggested for the treatment of disorder-induced local lattice relaxationeffects. It supplements the description of the substitutional disorder withinthe coherent potential approximation. We demonstrate the excellent accuracy ofthe method by comparison with calculations performed by means ofthe projector augumented wave method on supercells constructed as specialquasirandom structures. At the same time, the efficiency of thetechnique allows for total energy calculations on a very finemesh of concentrations which enables a reliable calculation of thesecond concentration derivative of the alloy total energy. This isa first step towards first-principles predictions of concentrations and temperatureintervals where the alloy decomposition proceeds via the spinodal mechanism.We thus calculate electronic structure, lattice parameter, and mixing enthalpiesof the quasibinary alloy c-Ti1−xAlxN. The lattice parameter follows Vegard'slaw at low fractions of AlN but deviates increasingly withincreasing Al content. We show that the asymmetry of themixing enthalpy and its second concentration derivative is associated withsubstantial variations of the electronic structure with alloy composition. Thephase diagram is constructed within the mean-field approximation.
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4.
  • Hultman, Lars, et al. (författare)
  • Interface structure in superhard TiN-SiN nanolaminates and nanocomposites : film growth experiments and ab initio calculations
  • 2007
  • Ingår i: Physical Review B. Condensed Matter and Materials Physics. - 1098-0121 .- 1550-235X. ; 75
  • Tidskriftsartikel (refereegranskat)abstract
    • Nanostructured materials-the subject of much of contemporary materials research-are defined by internal interfaces, the nature of which is largely unknown. Yet, the interfaces determine the properties of nanocomposites and nanolaminates. An example is nanocomposites with extreme hardness70-90 GPa, which is of the order of, or higher than, diamond. The Ti-Si-N system, in particular, is attracting attention for the synthesis of such superhard materials. In this case, the nanocomposite structure consists of TiN nanocrystallites encapsulated in a fully percolated SiNx "tissue phase" (1 to 2 monolayers thick) that is assumed to be amorphous. Here, we show that the interfacial tissue phase can be crystalline, and even epitaxial with complex surface reconstructions. Using in situ structural analyses combined with ab initio calculations, we find that SiNx layers grow epitaxially, giving rise to strong interfacial bonding, on both TiN(001) and TiN(111) surfaces. In addition, TiN overlayers grow epitaxially on SiNx/TiN(001) bilayers in nanolaminate structures. These results provide insight into the development of design rules for new nanostructured materials.
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5.
  • Joelsson, Torbjörn, 1972-, et al. (författare)
  • Phase stability tuning in the NbxZr1-xN thin-film system for large stacking fault density and enhanced mechanical strength
  • 2005
  • Ingår i: Applied Physics Letters. - : AIP Publishing. - 0003-6951 .- 1077-3118. ; 86:13
  • Tidskriftsartikel (refereegranskat)abstract
    • The phase stability of hexagonal WC-structure and cubic NaCl-structure 4d transition metal nitrides was calculated using first-principles density functional theory. It is predicted that there is a multiphase or polytypic region for the 4d transition metal nitrides with a valence electron concentration around 9.5 to 9.7 per formula unit. For verification, epitaxial NbxZr1-xN (0 <= x <= 1) was grown by reactive magnetron sputter deposition on MgO(001) substrates and analyzed with transmission electron microscopy (TEM) and x-ray diffraction. The defects observed in the films were threading dislocations due to nucleation and growth on the lattice-mismatched substrate and planar defects (stacking faults) parallel to the substrate surface. The highest defect density was found at the x=0.5 composition. The nanoindentation hardness of the films varied between 21 GPa for the binary nitrides, and 26 GPa for Nb0.5Zr0.5N. Unlike the cubic binary nitrides, no slip on the preferred [1 (1) over bar0]{110} slip system was observed. The increase in hardness is attributed to the increase in defect density at x=0.5, as the defects act as obstacles for dislocation glide during deformation. The findings present routes for the design of wear-resistant nitride coatings by phase stability tuning.
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6.
  • Lu, Jun, et al. (författare)
  • On Epitaxy of Ultrathin Ni1-xPtx Silicide Films on Si(001)
  • 2010
  • Ingår i: Electrochemical and solid-state letters. - : The Electrochemical Society. - 1099-0062 .- 1944-8775. ; 13:10, s. H360-H362
  • Tidskriftsartikel (refereegranskat)abstract
    • Epitaxial Ni(Pt)Si2-y (y < 1) films readily grow upon thermal treatment of 2 nm thick Ni and Ni0.96Pt0.04 films deposited on Si(001). For annealing at 500 degrees C, the films are 5.4-5.6 nm thick with 61-70 mu cm in resistivity. At 750 degrees C, the epitaxial Ni(Pt)Si2-y films become 6.1-6.2 nm thick with a resistivity of 42-44 mu cm. Structural analysis reveals twins, facet wedges, and thickness inhomogeneities in the films grown at 500 degrees C. For higher temperature, an almost defect-free NiSi2-y film with a flat and sharp interface is formed. The presence of Pt makes the aforementioned imperfections more persistent.
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7.
  • Lu, Jun, et al. (författare)
  • Stacking fault energies in austenitic stainless steels
  • 2016
  • Ingår i: Acta Materialia. - : Elsevier. - 1359-6454 .- 1873-2453. ; 111, s. 39-46
  • Tidskriftsartikel (refereegranskat)abstract
    • We measure the stacking fault energy of a set of 20 at% Cr-austenitic stainless steels by means of transmission electron microscopy using the weak beam dark field imaging technique and the isolated dislocations method. The measurements are analyzed together with first principles calculations. The results show that experiment and theory agree very well for the investigated concentration range of Mn (0-8%) and Ni (11-30%). The calculations show that simultaneous relaxation of atomic and spin degrees of freedom is important in order to find the global energy minimum for these materials. Our results clearly show the great potential of the weak beam dark field technique to obtain accurate measurements of the stacking fault energy of austenitic steels and that the reliable predictability of first principles calculations can be used to design new steels with optimized mechanical properties.
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8.
  • Luo, Jun, et al. (författare)
  • On Different Process Schemes for MOSFETs With a Controllable NiSi-Based Metallic Source/Drain
  • 2011
  • Ingår i: IEEE Transactions on Electron Devices. - : IEEE Institute of Electrical and Electronics. - 0018-9383 .- 1557-9646. ; 58:7, s. 1898-1906
  • Tidskriftsartikel (refereegranskat)abstract
    • This paper focuses on different silicidation schemes toward a controllable NiSi-based metallic source/drain (MSD) process with restricted lateral encroachment of NiSi. These schemes include thickness control of Ni, Ni-Pt alloying, and two-step annealing. Experimental results show that all the three process schemes can give rise to effective control of lateral encroachment during Ni silicidation. By controlling t(Ni), NiSi-based MSD metal-oxide-semiconductor field-effect transistors (MOSFETs) of gate length L-G = 55 nm are readily realized on ultrathin-body silicon-on-insulator substrates with 20-nm surface Si thickness. With the aid of dopant segregation (DS) to modifying the Schottky barrier heights of NiSi, both n- and p-type MSD MOSFETs show significant performance improvement, compared to reference devices without DS.
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9.
  • Nedfors, Nils, et al. (författare)
  • Reactive sputtering of NbCx-based nanocomposite coatings : an up-scaling study
  • 2014
  • Ingår i: Surface & Coatings Technology. - : Elsevier BV. - 0257-8972 .- 1879-3347. ; 253, s. 100-108
  • Tidskriftsartikel (refereegranskat)abstract
    • Nanocomposite Nb-C coatings, with a C/Nb ratio of 0.93 - 1.59, have been deposited by reactive sputtering in a commercial sputtering system at deposition rates of up to 200 nm/min. The coatings are compared to non-reactively sputtered Nb-C in lab-scale equipment at deposition rates two orders of magnitude lower. X-ray diffraction, X-ray photoelectron spectroscopy, and electron microscopy are used to conclude that all coatings consist of nanocrystalline NbCx grains (nc-NbCx) embedded in a matrix of amorphous C (a-C). The coating performance was evaluated in terms of their mechanical, tribological, and electrical properties. The chemical stability of the coatings was evaluated by exposure to a flowing mixture of corrosive gases. It is found that the coatings have comparable microstructure and performance to the coatings deposited by non-reactive sputtering. The high deposition rate and presence of different C-radicals on the coating surface during film growth for the reactively sputtered coatings is believed to result in a smaller NbCx grain size compared to the non-reactively sputtered coatings (reactive process: 10 – 3 nm, non-reactive process: ~75 – 3 nm). This difference results in a thinner a-C matrix of about 0.2 nm, which is not varying with C content for the reactively sputtered coatings. The thinner a-C matrix is reflected in coating properties, with a higher conductivity and slightly higher hardness. The coating richest in C content (C/Nb ratio 1.59) shows the lowest friction (0.23), wear rate (0.17x10-6 mm3/mN), and contact resistance before (11 mΩ at 10 N) and after (30 mΩ at 10 N) the chemical stability test. These results imply that nc-NbCx/a-C coatings of this composition are a good candidate for electrical contact applications, and that up-scaling of the process is achievable.
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10.
  • Nedfors, Nils, et al. (författare)
  • Superhard NbB2-x thin films deposited by dc magnetron sputtering
  • 2014
  • Ingår i: Surface & Coatings Technology. - : Elsevier BV. - 0257-8972 .- 1879-3347. ; 257, s. 295-300
  • Tidskriftsartikel (refereegranskat)abstract
    • We have deposited weakly textured substoichiometric NbB2-x thin films by magnetron sputtering from a NbB2 target. The films exhibit superhardness (42 ± 4 GPa), previously only observed in overstoichiometric TiB2 thin films, and explained by a self-organized nanostructuring, where thin TiB2 columnar grains hinder nucleation and slip of dislocations and a B-rich tissue phase between the grains prevent grain-boundary sliding. The wide homogeneity range for the NbB2 phase allows a similar ultra-thin B-rich tissue phase to form between thin (5 – 10 nm) columnar NbB2-x grains also for films with a B/Nb atomic ratio of 1.8, as revealed here by analytical aberration-corrected scanning transmission electron microscopy. Furthermore, a coefficient of friction of 0.16 is measured for a NbB2-x film sliding against stainless steel with a wear rate of 4x10-7 mm3/Nm. X-ray photoelectron spectroscopy results suggest that the low friction is due to the formation of a lubricating boric acid film.
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