Photoluminescence measurements in the phase transition region of Zn1-x Cd (x) S films

• Thin films of Zn1-x Cd (x) S (0.1 a parts per thousand currency sign x a parts per thousand currency sign 0.5) were prepared by using pulsed laser ablation technique on corning glass substrates. Phase transition from cubic to hexagonal in Zn1-x Cd (x) S films is determined by X-ray diffraction analysis. We observed a lowering in the phase transition temperature with increase in the cadmium concentration. Transmission electron microscopy suggests the crystalline nature of thin films with average particle size of 15 nm. The grown Zn1-x Cd (x) S samples show the high peak intensity ratio of the near band edge emission to the defect center luminescence even at room temperature, which indicates the small concentration of complex defects in the samples. Photoluminescence measurement show stoichiometric dependence of the energy band gap and is found to have quadratic dependence on x.

Keyword

Photoluminescence

XRD

TEM

Laser diodes

Light emitting diodes

TECHNOLOGY

TEKNIKVETENSKAP

Publication and Content Type

ref (subject category)

art (subject category)