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Infrared ellipsometry and Raman studies of hexagonal InN films : Correlation between strain and vibrational properties
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- Darakchieva, Vanya (author)
- Linköpings universitet,Tekniska högskolan,Halvledarmaterial
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- Paskov, Plamen (author)
- Linköpings universitet,Tekniska högskolan,Halvledarmaterial
- Valcheva, E. (author)
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- (creator_code:org_t)
- Elsevier BV, 2004
- 2004
- English.
- In: Superlattices and Microstructures. - : Elsevier BV. - 0749-6036 .- 1096-3677. ; 36:4-6, s. 573-580
- Journal article (peer-reviewed)
Abstract
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- The vibrational properties of InN films with different strain have been studied using Infrared ellipsometry and Raman scattering spectroscopy. We have established a correlation between the phonon mode parameters and the strain, which allows the determination of the deformation potentials and the strain-free frequencies of the InN E1(TO) and E2 modes. The LO phonons and their coupling to the free-carrier plasmon excitations are also discussed in relation to the carrier concentration in the films. © 2004 Elsevier Ltd. All rights reserved.
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- TECHNOLOGY
- TEKNIKVETENSKAP
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- art (subject category)
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- Lu, H.
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